2008
DOI: 10.1364/oe.16.011718
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Phase sensitive optical near-field mapping using frequency-shifted laser optical feedback interferometry

Abstract: The use of laser optical feedback Imaging (LOFI) for scattering-type scanning near-field optical microscopy (sSNOM) is proposed and investigated. We implement this sensitive imaging method by combining a sSNOM with optical heterodyne interferometry and the dynamic properties of a B class laser source which is here used both as source and detector. Compared with previous near field optical heterodyne experiments, this detection scheme provides an optical amplification that is several orders of magnitude higher,… Show more

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Cited by 25 publications
(19 citation statements)
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“…The extrema of the long-time solutions are extracted and represented as functions of ν. TakingĒ x,y rather than E x,y allows us to remove the fast 200-MHz oscillation from the time series (see also Figs. [4][5][6][7][8][9]. ν is progressively increased, and the previous numerical long-time solution serves as an initial condition for the following computation.…”
Section: Bifurcation Diagramsmentioning
confidence: 99%
See 1 more Smart Citation
“…The extrema of the long-time solutions are extracted and represented as functions of ν. TakingĒ x,y rather than E x,y allows us to remove the fast 200-MHz oscillation from the time series (see also Figs. [4][5][6][7][8][9]. ν is progressively increased, and the previous numerical long-time solution serves as an initial condition for the following computation.…”
Section: Bifurcation Diagramsmentioning
confidence: 99%
“…In particular, class-B lasers are extremely sensitive to frequency-shifted feedback (FSF) when the frequency shift is close to the laser-relaxationoscillation (RO) frequency f R . This fact has been exploited, for instance, for imaging purposes [5].…”
Section: Introductionmentioning
confidence: 99%
“…Near-field optical imaging of plasmonic devices using heterodyne optical feedback on Er doped DFB fiber laser Laser Feedback Interferometry (LFI) has been already investigated as an efficient tool for near-field optical imaging [1,2]. In this specific approach, the optical near-field collected by a micro tip on the top of the studied sample is frequency shifted before being re-injected in the single-frequency class B laser used to illuminate the device.…”
Section: To Cite This Versionmentioning
confidence: 99%
“…Recently, several phase sensitive measurements in the near field have been reported [3][4][5][6]. Some of the phase measurements are based on the scattering type SNOM (s-SNOM) that uses an apertureless atomic force microscopy (AFM) tip combined with heterodyne interferometry [7][8][9].…”
Section: Introductionmentioning
confidence: 99%