“…These limitations prevent the applicability of all aforementioned methods for samples that present sharply changing topography or position changes of µm scale, especially when high acquisition rate is required, which is often the case. Multiple wavelength illumination phase unwrapping is the simplest solution to this limitation, while maintaining the speed of acquisition, and has already been implemented in holography [18] and, later, in PSI [19], quantitative phase imaging [20,21], DHM [22], off-axis interferometry [23], and fringe pattern profilometry [24]. However, this solution further complicates the system design.…”