2021
DOI: 10.1007/s12274-021-3725-0
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Photocatalytic nitrogen reduction to ammonia: Insights into the role of defect engineering in photocatalysts

Abstract: Engineering of defects in semiconductors provides an effective protocol for improving photocatalytic N2 conversion efficiency. This review focuses on the state-of-the-art progress in defect engineering of photocatalysts for the N2 reduction toward ammonia. The basic principles and mechanisms of thermal catalyzed and photon-induced N2 reduction are first concisely recapped, including relevant properties of the N2 molecule, reaction pathways, and NH3 quantification methods. Subsequently, defect classification, s… Show more

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Cited by 101 publications
(62 citation statements)
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References 335 publications
(466 reference statements)
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“…[31] The existence of a large number of anion vacancies was also confirmed by electron paramagnetic resonance (EPR) spectroscopy, where the WC had a very weak signal, while a strong resonance line appeared at g of 2.0026 in the WC-N/W-1200 electrode (Figure S8, Supporting Information). [32] These defects can effectively alter the periodic structure of the crystal and affect the chemical properties and the electronic structure of the catalyst, improving the intrinsic catalytic activity and exposing more active sites, thereby the HER performance is improved. [33] These findings confirm that NH 3 gradually destroyed the surface crystal lattice of WC grains, and N was doped into the WC crystal lattice, which is in good agreement with the XPS and Raman spectra.…”
Section: Structural Featuresmentioning
confidence: 99%
“…[31] The existence of a large number of anion vacancies was also confirmed by electron paramagnetic resonance (EPR) spectroscopy, where the WC had a very weak signal, while a strong resonance line appeared at g of 2.0026 in the WC-N/W-1200 electrode (Figure S8, Supporting Information). [32] These defects can effectively alter the periodic structure of the crystal and affect the chemical properties and the electronic structure of the catalyst, improving the intrinsic catalytic activity and exposing more active sites, thereby the HER performance is improved. [33] These findings confirm that NH 3 gradually destroyed the surface crystal lattice of WC grains, and N was doped into the WC crystal lattice, which is in good agreement with the XPS and Raman spectra.…”
Section: Structural Featuresmentioning
confidence: 99%
“…Photocatalytic ammonia (NH 3 ) synthesis using air and water under mild conditions is an appealing alternative to the traditional Haber–Bosch scheme as an intensive energy consumption and massive carbon dioxide emission process. The ideal scenario often requires effectively initial N 2 activation to overcome the first proton-coupled electron transfer (PCET) process, that is, N 2 + e – → N 2 – , or N 2 + e – + H + → N 2 H, which is generally regarded as the rate-determining step. Many oxide photocatalysts, such as bismuth-based oxide, including BiOBr, , BiO, BiOCl, Bi 5 O 7 Br, layered-double-hydroxide (LDH), , TiO 2 , and WO 3 , expose the feasibility of N 2 fixation. The catalytic activity is often attributed to surface oxygen vacancy (OV), which can effectively activate the strong NN triple bond and facilitate the photogenerated electrons transfer from the photocatalyst to N 2 .…”
Section: Introductionmentioning
confidence: 99%
“…[40] However, they may not be associated exclusively with beneficial effects as they may also act as recombination centers or undesired trap states, especially in the case of bulk defects, thus reducing the photocatalytic activity. [41] As such, improving our understanding of the structure and properties of defects would help the rational design of highperformance semiconductor photocatalysts. Oxygen vacancies are responsible for N 2 photofixation in In(OH) 3 /C 3 N 4 catalysts, [42] bismuth oxyhalide-based materials, [43] TiO 2 -containing catalysts, [40] In 2 O 3 /In 2 S 3 , [44] W 18 O 49 -based materials, [45] or Fe-doped SrMoO 4 .…”
Section: Photocatalytic Nitrogen Reduction Reactionmentioning
confidence: 99%