“…The trap states may be related to defects such as dopants, or defects localized in lattice discontinuities (dislocations, grain boundaries and interfaces), or oxygen adsorption at the surface, and or the surface damage during the device processing. Furthermore, it is worthy to note that the 90%-10% fall time is much shorter than that have been reported on the MSM photoconductive detectors based on unintentionally doped ZnO thin films [3,4,7,8], and this may be due to the enhancement of tunnelling recombination across the potential barriers generated by surface and defects with Al doping in ZnO, as the similar behavior was observed in the Si-doped Al x Ga 1−x N photoconductive detectors [14]. The reasons related to the temporal response are analyzed hereinbefore, and the deep mechanisms still need to study further.…”