Photoluminescence and xray photoelectron spectroscopy study of Spassivated InGaAs (001) We performed a correlated study of sulfide-passivated GaAs͑001͒ surfaces, using x-ray photoelectron spectroscopy and reflection anisotropy spectroscopy. The reflection anisotropy spectra reveal after desorption of the sulfide overlayer the presence of As and Ga dimers analogous to ones observed on As-decapped surfaces. We identify in the 3d core-level spectra the surface components due to As and Ga dimers: their chemical shifts are Ϫ0.28 and Ϫ0.35 eV, respectively. We propose an interpretation of the main surface components in the framework of a simple model, based on charge neutrality, electron counting, and electronegativity concepts.