1973
DOI: 10.1007/978-94-010-2647-5_25
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Photoemission and Secondary Electron Emission from Lunar Surface Material

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Cited by 72 publications
(63 citation statements)
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“…The dayside lunar surface also provides a source of low energy photoelectrons produced by solar photons and secondary electrons produced by both electron and ion impact, as well as reflected and backscattered primary electrons (Feuerbacher et al, 1972;Willis et al, 1973;Whipple, 1981;Horányi et al, 1998).…”
Section: Introductionmentioning
confidence: 99%
“…The dayside lunar surface also provides a source of low energy photoelectrons produced by solar photons and secondary electrons produced by both electron and ion impact, as well as reflected and backscattered primary electrons (Feuerbacher et al, 1972;Willis et al, 1973;Whipple, 1981;Horányi et al, 1998).…”
Section: Introductionmentioning
confidence: 99%
“…Halekas et al (2009) reported the first in situ measurements of secondary electron emission efficiency of a lunar regolith. They found that the secondary emission yield from this material is a factor of ≈3 lower than that measured under laboratory conditions (Willis et al 1973;Horányi et al 1998;Němeček et al 2011). The authors discussed the discrepancy between their observations and laboratory measurements and concluded that it might result from the roughness and irregular shape of the lunar regolith, which likely affect the escape of secondary electrons from the surface.…”
Section: Introductionmentioning
confidence: 87%
“…The lunar material current density at normal sunlight incidence angle is J p0 = 4.5 µA/m 2 at 1 AU for lunar dust [12]. The secondary emission from particle impact [12] is assumed to be low at the surface, but the secondary emission model of [13] is implemented for the emission induced by electron impact in the volume.…”
Section: B Lander Insertionmentioning
confidence: 99%
“…The secondary emission from particle impact [12] is assumed to be low at the surface, but the secondary emission model of [13] is implemented for the emission induced by electron impact in the volume. This model depends on the inverse of the energy required to excite a single secondary electron (K = 0.01 eV -1 ), the inverse of the absorption length for secondary electrons (α =10 8 m -1 ), and the Whiddington constant for the rate loss with distance (a = 10 14 V 2 .m -1 ).…”
Section: B Lander Insertionmentioning
confidence: 99%
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