Photoion yield spectra of the lanthanides in the region of the 5<i>p</i>excitation: The elements Gd, Tb, Dy, Ho, Er, Tm, and Yb

Dzionk, C.; Fiedler, W.; Lücke, M.; Zimmermann, Peter

doi:10.1103/physreva.41.3572

Cited by 10 publications

(4 citation statements)

References 9 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…They used time-of-flight technique and excitation by synchrotron radiation. With the same technique all the stable elements of the rare earths recently were investigated (Dzionk et al 1989b(Dzionk et al , 1990. Figure 51 shows the results for the photoion yield spectra of singly and doubly charged photoions Ce, Nd, Eu, Tb, Ho, and Yb.…”

Section: Rare Earthsmentioning

confidence: 99%

XUV spectroscopy of metal atoms

1992

View full text Add to dashboard Cite

The xuv spectra of free metal atoms obtained by absorption, photoion, photoelectron ana two-photon spectroscopy are reviewed. iine experimentai resuirs are discussed in comparison with the predictions of the different theorstical approaches. Emphasis is put on the basic excitation and de-excitation processes, the importance of electron correlation, on common features of groups and on trends along series.

show abstract

Section: Rare Earthsmentioning

confidence: 99%

XUV spectroscopy of metal atoms

1992

View full text Add to dashboard Cite

show abstract

“…Nicklin et al 29 measured the total electron yield of Tm layers at Tm N 4,5 edges. Dzionk et al 30 measured the photoion yield spectra generated by EUV radiation on an atomic beam of Tm and other lanthanides. Electron energy loss spectroscopy in reflection mode of Tm and other lanthanides was investigated by Netzer et al 31 Henke et al 32 obtained a semiempirical set of data in the 30-10 000 eV range ͓later extended to 30 000 eV ͑Ref.…”

Section: Introductionmentioning

confidence: 99%

Transmittance and optical constants of Tm films in the 2.75–1600 eV spectral range

Vidal-Dasilva

Fernández-Perea

Aznárez

et al. 2009

Journal of Applied Physics

View full text Add to dashboard Cite

The optical constants of thulium (Tm) films were obtained in the 2.75-1600 eV range from transmittance measurements performed at room temperature. Thin films of Tm were deposited by evaporation in ultrahigh vacuum conditions and their transmittance was measured in situ. Tm films were deposited onto grids coated with a thin, C support film. Transmittance measurements were used to obtain the optical extinction coefficient k of Tm films. The refractive index n of Tm was calculated using the Kramers-KrÃ¶nig analysis. k data were extrapolated both on the high and the low energy sides by using experimental and calculated extinction coefficient values available in the literature. Tm, similar to other lanthanides, has a low-absorption band below the O 2,3 edge onset; the lowest absorption was measured at âˆ¼23 eV. Therefore, Tm is a promising material for filters and multilayer coatings in the energy range below the O2,3 edge in which materials typically have an absorption stronger than away. Good consistency of the data was obtained through f and inertial sum rules

show abstract

“…Dzionk et al [28] were able to observe the 5p (O) excitations in Gd, Tb, Dy, Er, Tm, and Yb by using the photoionic yields from these elements.…”

Section: Introduction Imentioning

confidence: 99%