Photoluminescence of GeSi/Si nanoclusters formed by sublimation molecular-beam epitaxy in GeH4 medium

Tunneling Atomic Force Microscopy of Self-Assembled In(Ga)As/GaAs Quantum Dots and Rings and of GeSi/Si(001) Nanoislands

“…It should be noted that in the structures grown by MBE the formation of the super dome islands has been observed in the process of the post-growth annealing (Kamins et al, 1999). In contrary, in SMBE in GeH 4 ambient the formation of the super dome islands has been observed just during growth (Filatov et al, 2008a(Filatov et al, , 2008b, that was attributed to Ostwald ripening.…”

“…The GeSi/Si(001) structures grown on the p-Si substrates with the nanoislands grown in the same conditions as the surface ones destined to the Tunnelling AFM studies but capped with the 40 nm thick cladding Si layers had been used for the optical investigations. It has been found that the nanoislands grown within T g = 600 ÷ 800C consisted of Ge x Si 1-x alloy with the Ge molar fraction x decreasing from 0.55 downto  0.25 with T g increasing from 600C up to 800C (Filatov et al, 2008b, Mashin et al, 2010.…”

“…20 are plotted vs the averaged Ge molar fraction in the nanoisland material <x> determined by PL spectroscopy and CRM (Filatov et al, 2008b, Mashin et al, 2010 in Fig. 22, a.…”

“…19, b & c. The buffer layers of  200 nm in thickness were doped heavily by boron up to the hole concentration ~ 10 18 cm -3 . More details on the growth technique can be found elsewhere (Filatov et al, 2008a(Filatov et al, , 2008b.…”

“…17, c & d), in accordance with Lifshits-Sloyzov-Wagner theory. The composition of the GeSi/Si(001) nanoislands' material has been examined by PL spectroscopy (Filatov et al, 2008a(Filatov et al, , 2008b and by Confocal Raman Microscopy (CRM, Mashin et al, 2010). The GeSi/Si(001) structures grown on the p-Si substrates with the nanoislands grown in the same conditions as the surface ones destined to the Tunnelling AFM studies but capped with the 40 nm thick cladding Si layers had been used for the optical investigations.…”