2021
DOI: 10.1039/d1ra07112b
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Photoluminescence properties of cuprous phosphide prepared through phosphating copper with a native oxide layer

Abstract: The presence of cuprous oxide results in band bending at the interface between cuprous phosphide and cuprous oxide, forming carrier traps, which improves the fluorescence properties of cuprous phosphide.

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Cited by 13 publications
(24 citation statements)
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“…Therefore, the frequency difference cannot be utilized to determine the thickness of Cu 3 P film. The Raman peaks of bulk Cu 3 P are centered at 273 and 607 cm −1 , respectively [9]. Compared with the bulk material, peak positions of Cu 3 P nanofilm shift and the frequency difference increases, which indicates the existence of the lattice defects and disorder [29,30].…”
Section: Resultsmentioning
confidence: 97%
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“…Therefore, the frequency difference cannot be utilized to determine the thickness of Cu 3 P film. The Raman peaks of bulk Cu 3 P are centered at 273 and 607 cm −1 , respectively [9]. Compared with the bulk material, peak positions of Cu 3 P nanofilm shift and the frequency difference increases, which indicates the existence of the lattice defects and disorder [29,30].…”
Section: Resultsmentioning
confidence: 97%
“…The peak at 524.5 cm −1 is corresponding to silicon [25,26], which was used to calibrate the peak position. There are two peaks centred at 253 and 632 cm −1 , which are due to Cu 3 P [9,27]. The frequency difference between the two peaks is constant, unlike Van Der Waals two-dimensional materials, such as graphene, hexagonal boron nitride and molybdenum sulfide, of which the frequency difference is a function of the film thickness [28].…”
Section: Resultsmentioning
confidence: 99%
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