Flame-melting rapid-cooling reactions
were used to synthesize a
number of pure phases of the Cs2MIIMIV
3Q8 family (MII = Mg, Zn, Cd, Hg;
MIV = Ge, Sn; Q = S, Se, Te) whereas the more toxic members
were synthesized using a traditional tube furnace synthesis. All Cs2MIIMIV
3Q8 compounds
presented here crystallize in the noncentrosymmetric space group P212121, except for Cs2ZnGe3S8, which crystallizes in the centrosymmetric
space group P21/n. The
structures contain chains of corner-sharing MIIQ4 and MIVQ4 tetrahedra linked by edge-sharing
MIV
2Q6 dimers to give a two-dimensional
structure. All phases are structurally similar to the AMIIIMIVQ4 (A = alkali metal, Tl; MIII = Al, Ga, In; MIV = Si, Ge, Sn; Q = S, Se) phases; however,
the members of this family have completely ordered MII and
MIV sites as opposed to the occupational disorder of MIII and MIV over all tetrahedral sites present in
AMIIIMIVQ4. The structural trends
of the Cs2MIIMIV
3Q8 family are discussed, along with a systematic study of their
optical properties. Density functional theory (DFT) electronic structure
calculations were performed using the projector augmented wave method
to further investigate the trends in the band gaps of the Cs2MIIMIV
3Se8 (MII = Mg, Zn; MIV = Ge, Sn) compounds. The experimental diffuse
reflectance UV–vis spectroscopy results show that the Mg compounds
have smaller band gaps than those containing Zn for both the Ge and
the Sn families whereas the DFT calculations show the opposite trend.
Cs2HgSn3Se8 was studied as a representative
example of this family using differential thermal analysis and melts
congruently at 595 °C. Crystal growth of this compound using
the Bridgman method resulted in a polycrystalline ingot from which
plate crystals ∼2 mm × 3 mm could be cleaved. The band
gap of the compounds varies from a narrow 1.07 eV for Cs2ZnGe3Te8 to a wide 3.3 eV for Cs2ZnGe3S8 and Cs2CdGe3S8 making this family a potentially useful source of materials
for a variety of electronic applications. Cs2HgSn3Se8 crystals exhibit photoconductivity response where
the photoexcited electron and hole show mobility-lifetime products
on the order of 3.69 × 10–5 cm2/V
and (μτ)h∥ = 7.78 ×
10–5 cm2/V, respectively.