2013
DOI: 10.1134/s1063785013120079
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Photomodulation fourier transform infrared spectroscopy of semiconductor structures: Features of phase correction and application of method

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Cited by 23 publications
(13 citation statements)
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“…The entire structure is terminated by the same GaAs 0.08 Sb 0.92 layer. In order to measure photoluminescence (PL) and photoreflectance (PR) in a wide spectral range an evacuated Fourier-transform (FT) spectrometer Bruker Vertex 80v was used and operated in step-scan mode (Firsov and Komkov 2013;Motyka et al 2009b;Motyka and Misiewicz 2010). A liquid-nitrogen cooled mercury cadmium telluride photodetector and a KBr beamsplitter were employed.…”
mentioning
confidence: 99%
“…The entire structure is terminated by the same GaAs 0.08 Sb 0.92 layer. In order to measure photoluminescence (PL) and photoreflectance (PR) in a wide spectral range an evacuated Fourier-transform (FT) spectrometer Bruker Vertex 80v was used and operated in step-scan mode (Firsov and Komkov 2013;Motyka et al 2009b;Motyka and Misiewicz 2010). A liquid-nitrogen cooled mercury cadmium telluride photodetector and a KBr beamsplitter were employed.…”
mentioning
confidence: 99%
“…The PR characterization was performed at 77 K with the technique based on a step‐scan FTIR spectrometer, and the state‐of‐art details of such PR measurement can be found in Refs. .…”
Section: Methodsmentioning
confidence: 99%
“…Similar FT-based approaches have been demonstrated as very efficient for probing QW transitions in the mid infrared range by several groups. [19][20][21][22] In our case, a liquid-nitrogen cooled MCT (mercury cadmium telluride) photodiode was used as a detector. In this measurement configuration, the pump beam was provided by the 660 nm line of a semiconductor laser diode, which was mechanically chopped at a frequency of 275 Hz.…”
Section: Methodsmentioning
confidence: 99%