The lithiated/delithiated vanadium pentoxide films deposited by sol-gel spin coating on indium tin oxide-coated glass substrates were analyzed by sputter-induced photon spectroscopy, X-ray diffraction, and optical absorption techniques. First, it is shown that the crystalline structure of where Li + ion is the host material and x the molar intercalation fraction.During the intercalation reaction, the vanadium atoms are considered to be partially reduced from V 5+ to V 4+ formal oxidation state, when 0 ≤ x ≤ 1. 6 The insertion/deinsertion processes of Li ions into V 2 O 5 matrix are often accompanied by electronic structure changes. V 2 O 5 as base material is semiconductor characterized by an energy gap and Na x V 2 O 5 10 deposited by physical vapor deposition technique.Note that these results were obtained by photoelectron spectroscopy (XPS and UPS). Concerning the deposition methods, they were listed by Granquist. 11 Besides, the properties of V 2 O 5 films show strong dependence on the synthesis procedures. Furthermore, the intercalation of lithium ions into V 2 O 5 leads to several changes in the electronic structure and optical and electrical properties. Hence, various electroanalytical techniques [12][13][14] have been used to explain the mechanisms of Li intercalation into this oxide.Using X-ray diffraction (XRD), optical absorption spectroscopy, and sputter-induced photon spectroscopy (SIPS) techniques, we investigate in this study the effect of Li insertion and deinsertion on the host lattice of V 2 O 5 thin film prepared by sol-gel spin coating procedure.The structure and optical absorption properties of clean, intercalated, and deintercalated V 2 O 5 films are discussed. The luminescence spectra resulting from 5 keV Kr + ion bombardment are also reported. The observed lines are all identified, and their intensities before and after