1997
DOI: 10.1049/el:19971097
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Photorefractive-damage-resistant Er-indiffusedMgO:LiNbO 3 ZnO-waveguide amplifiers and lasers

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Cited by 40 publications
(55 citation statements)
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“…One can see from Fig. 1 that all of the substrate signals 6 Li, 181 Ta and 16 O show constancy with the depth after a shallow depth range, where the diffusion reservoir was formed [15]. This is because these substrate constituents are homogeneous over each sample plate.…”
Section: Er 3+ Diffusivitymentioning
confidence: 90%
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“…One can see from Fig. 1 that all of the substrate signals 6 Li, 181 Ta and 16 O show constancy with the depth after a shallow depth range, where the diffusion reservoir was formed [15]. This is because these substrate constituents are homogeneous over each sample plate.…”
Section: Er 3+ Diffusivitymentioning
confidence: 90%
“…The analysis was accomplished by a time-of-flight second ion mass spectrometry (ION-TOF TOF SIMS V). A Cs + -beam (∼45 m in diameter) of 30-35 nA at 3 keV was used to sputter a crater of 120 × 120 m 2 and a pulsed bismuth ion beam of 1 pA at 25 keV was used to analyze the secondary ions 6 Li, 181 Ta, 16 O and 166 Er as a function of time. Positive secondary ions were detected.…”
Section: Experimental Descriptionmentioning
confidence: 99%
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