2006
DOI: 10.1088/0022-3727/39/12/006
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Photosensitivity of 20GeO2 : 80SiO2hydrogen-loaded and non-hydrogen-loaded thin films

Abstract: Photosensitive materials offer great potential for passive and active optical devices in communication, data manipulation and storage. We prepared photosensitive germanosilicate (20GeO2 : 80SiO2) inorganic thin films by the sol–gel method. These films were annealed at various temperatures in the range of 700–900 °C. The films annealed at 900 °C were found to be fully densified and were porous when annealed below 900 °C. The UV KrF laser (248 nm) has been used to induce refractive index change (Δn). We have stu… Show more

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Cited by 3 publications
(1 citation statement)
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“…Moreover, research shows that the hydrogen loading is less practical in the case of planar waveguides because of the rapid hydrogen out diffusion [1]. Recently, an increase in the refractive index of about 0.009 [5,12] was observed in the solgel derived films irradiated by UV light using the KrF excimer laser. The relatively large change in the refractive index is attributed to the creation of oxygen related defects by the UV radiation.…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, research shows that the hydrogen loading is less practical in the case of planar waveguides because of the rapid hydrogen out diffusion [1]. Recently, an increase in the refractive index of about 0.009 [5,12] was observed in the solgel derived films irradiated by UV light using the KrF excimer laser. The relatively large change in the refractive index is attributed to the creation of oxygen related defects by the UV radiation.…”
Section: Introductionmentioning
confidence: 99%