Photovoltaic module performance and durability following long-term field exposure

Abstract

Our investigations of both new and field-aged photovoltaic modules have indicated that, in general, today's commercially available modules are a highly reliable product. However, by using new test procedures, subtle failure mechanisms have also been identified that must be addressed in order to achieve 30-year module lifetimes. This paper summarizes diagnostic test procedures, results, and implications of in-depth investigations of the performance and durability characteristics of commercial modules after long-term field exposure. A collaborative effort with U.S. module manufacturers aimed at achieving 30-year module lifetimes is also described. Sandia is a multi-program laboratory operated by Sandia Corporation, a Lockheed Martin Company, for the U.S. Department of Energy under contract DE-ACO4-94AL8500.

An investigation into hot‐spots in two large grid‐connected PV plants

“…15,16 Nevertheless, in our case, the modules are new and the failure occurred within few years, which seems to indicate a specific and faulty manufacturing process. This series resistance is responsible for the irreversible degradation of the affected PV modules, as the following section shows, as well as a part of the measured power losses.…”

Reliability and Degradation of Solar PV Modules—Case Study of 19-Year-Old Polycrystalline Modules in Ghana

“…However, industry players are seeking to extend warranty periods to 30 years [21], which would imply a maximum average annual performance decline of no more than 0.65% (Figure 1). Solar PV warranties typically encounter two major hurdles.…”

Degradation pathway models for photovoltaics module lifetime performance

“…Many different pathways can be activated by different stressors or stress levels and need to be incorporated into the PVM L&DS model. Figure 1 shows a theoretical PV module degradation pathway model, which is based on observations from both real-world exposed modules and modules subjected to accelerated test conditions [13], [14], [15], [16], [17], [18]. When module failure modes can be attributed to processes that are only activated under accelerated exposure conditions or accelerated exposure conditions are chosen that fail to activate pathways observed in field-exposed modules, it signals inappropriate exposure conditions with little basis in reality.…”