2009
DOI: 10.1016/j.microrel.2009.06.048
|View full text |Cite
|
Sign up to set email alerts
|

Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
8
0

Year Published

2012
2012
2019
2019

Publication Types

Select...
2
2
1

Relationship

0
5

Authors

Journals

citations
Cited by 9 publications
(8 citation statements)
references
References 11 publications
0
8
0
Order By: Relevance
“…Based on the already published results in the literature [14,74,34,64,35] and results of this work, it has become apparent that digital Intrinsic PUFs are not sensitive to sample preparation and optical semi-invasive attacks in their current configurations. By launching different classes of semi-invasive attacks, we demonstrated that Intrinsic PUFs are vulnerable to these attacks their responses can be predicted, manipulated and probed.…”
Section: Discussionmentioning
confidence: 66%
See 4 more Smart Citations
“…Based on the already published results in the literature [14,74,34,64,35] and results of this work, it has become apparent that digital Intrinsic PUFs are not sensitive to sample preparation and optical semi-invasive attacks in their current configurations. By launching different classes of semi-invasive attacks, we demonstrated that Intrinsic PUFs are vulnerable to these attacks their responses can be predicted, manipulated and probed.…”
Section: Discussionmentioning
confidence: 66%
“…Therefore, an NVM might be replaced with a PUF to make the secrets volatile, harder to extract and even tamper-evident to invasive attacks. Indeed, one can deploy delay-based PUFs and distribute its elements on the whole area of a chip to develop a sensor to detect the FIB microprobing attempts by observing the intrinsic behavior of the PUF [14,74].…”
Section: Discussionmentioning
confidence: 99%
See 3 more Smart Citations