2016
DOI: 10.1016/j.jmst.2015.10.018
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Physical Mechanism and Performance Factors of Metal Oxide Based Resistive Switching Memory: A Review

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Cited by 109 publications
(60 citation statements)
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“…Materials of RS medium play a decisive role in the switching process, which has a direct and significant influence on the performance of RRAM devices such as ON/OFF ratio and device stability. On the other hand, electrode materials of RRAM devices more affect switching modes of RRAM devices, which should also be under further investigation [13,14,18,48,63,64].…”
Section: Thin Film Materials Of Rram Devicesmentioning
confidence: 99%
“…Materials of RS medium play a decisive role in the switching process, which has a direct and significant influence on the performance of RRAM devices such as ON/OFF ratio and device stability. On the other hand, electrode materials of RRAM devices more affect switching modes of RRAM devices, which should also be under further investigation [13,14,18,48,63,64].…”
Section: Thin Film Materials Of Rram Devicesmentioning
confidence: 99%
“…RRAM consists of an insulating layer (I) sandwiched between the two metal (M) electrodes [11,12]. RRAM relies on the formation and the rupture of conductive filaments corresponding to LRS and HRS, respectively, in the insulator between two electrodes [13][14][15].…”
Section: Introductionmentioning
confidence: 99%
“…There are memristors with different resistive switching mechanisms: phase change memory, [5] electrochemical metallization, [6] valence change memory, [7] Fowler-Nordheim tunneling, [8] redox reactions in organic polymers, [9] etc. [10] A part of them is based on the filamentary mechanism: formation or destruction of filament at bias voltage leads the memristor to a high resistive state (HRS) or low resistive state (LRS), respectively.…”
Section: Introductionmentioning
confidence: 99%