2008 International Conference on Advanced Semiconductor Devices and Microsystems 2008
DOI: 10.1109/asdam.2008.4743356
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Physical Modelling of a Step-Graded AlGaAs/GaAs Gunn Diode and Investigation of Hot Electron Injector Performance

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Cited by 8 publications
(5 citation statements)
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“…The double Gunn effect is then implemented in these standard models to simulate the performance. These standard models have already shown satisfactory agreement with the commercially developed Gunn diode device [13]. These models, however, do not describe the double Gunn effect, which has only been shown in EMC simulation.…”
Section: Physical Modelsmentioning
confidence: 98%
“…The double Gunn effect is then implemented in these standard models to simulate the performance. These standard models have already shown satisfactory agreement with the commercially developed Gunn diode device [13]. These models, however, do not describe the double Gunn effect, which has only been shown in EMC simulation.…”
Section: Physical Modelsmentioning
confidence: 98%
“…where n 1 = electron density in Γ valley, n 2 = electron density in L valley. Above the high field, E H , most electrons reside in the L valley, and the device behaves as a passive resistance (of greater magnitude) once again [15,16].…”
Section: State Of the Art Of The Gunn Diodementioning
confidence: 99%
“…Above the high field, E H , most electrons reside in the L valley, and the device behaves as a passive resistance (of greater magnitude) once again .…”
Section: State Of the Art Of The Gunn Diodementioning
confidence: 99%
“…Advances in Gunn diode structure using various methods to reduce the dead zone have been investigated through the years. For example, a GaAs-based Gunn diode with a step-graded gap launcher has long been commercialised and used succesfully [8] due to its high efficiency and output power, temperature stability, as well as low output noise [9]. A step-graded gap launcher followed by a thin δ-doped layer improved the Gunn diode's performance by eliminating the dead zone in the transit region of the device [10][11][12][13].…”
Section: Introductionmentioning
confidence: 99%