Physical properties of sprayed antimony doped tin oxide thin films: The role of thickness

Abstract

Transparent conducting antimony doped tin oxide (Sb:SnO 2 / thin films have been deposited onto preheated glass substrates using a spray pyrolysis technique by varying the quantity of spraying solution. The structural, morphological, X-ray photoelectron spectroscopy, optical, photoluminescence and electrical properties of these films have been studied. It is found that the films are polycrystalline in nature with a tetragonal crystal structure having orientation along the ( 211) and ( 112) planes. Polyhedrons like grains appear in the FE-SEM images. The average grain size increases with increasing spraying quantity. The compositional analysis and electronic behaviour of Sb:SnO 2 thin films were studied using X-ray photoelectron spectroscopy. The binding energy of Sn3d 5=2 for all samples shows the Sn 4C bonding state from SnO 2 . An intensive violet luminescence peak near 395 nm is observed at room temperature due to oxygen vacancies or donor levels formed by Sb 5C ions. The film deposited with 20 cc solution shows 70 % transmittance at 550 nm leading to the highest figure of merit (2.11 10 3 1 /. The resistivity and carrier concentration vary over 1.22 10 3 to 0.89 10 3 cm and 5.19 10 20 to 8.52 10 20 cm 3 , respectively.

Evaluation of an Nd doping effect on characteristic properties of tin oxide

“…The similar relation between the precursor solution and preferred orientation was also found in some studies [3,39,40]. The standard deviation is determined by relation [41] σ ¼…”

“…1. 4 at% and 5 at% Nd contents introduce onset of heterogeneous nucleation and an increment in adsorption-desorption phenomenon [10,41,42].…”

Spray deposited Mg-doped SnO2 thin film LPG sensor: XPS and EDX analysis in relation to deposition temperature and doping

“…The preferential growth of polycrystalline thin films is studied by calculating the texture coefficient (TC) [27] from the reflection intensities of the XRD lines. where I (hkl) is the measured intensity of X-ray reflection, I 0(hkl) is the corresponding conventional intensity from the JCPDS data card No.…”

Effects of heat treatment on fluorine-doped tin oxide anti-reflection films coated on silicon spheres

“…26)28) The properties of SnO 2 films can be influenced by doping. Among various possible dopants such as antimony 27) and fluorine (F), 24),25),28) F is probably the most effective for SnO 2 because such films show very high transparency and good conductivity, 28) and the ionic radius of F (133 pm) is close to that of O (140 pm). 29) To develop Fdoped SnO 2 films for use as AR films in solar cells, lowcost and damage-free preparation processes are required.…”