Poly(acrylic acid) films with a thickness of about 150 nm were deposited using a pulsed plasma onto aluminum and glass. The structure/property relationships of these samples were studied in dependence to the duty cycle (DC) of the plasma by a broad combination of different techniques and probes. For the first time, volume sensitive methods (FTIR, dielectric spectroscopy, and differential scanning calorimetry) are combined with surface analyses i.e. XPS. For an unambiguous identification of COOH groups by XPS, derivatization with trifluoroethanol was accomplished. Quantitative FTIR investigations give qualitatively a dependence of the concentration of COOH groups upon DC similar to that given by XPS investigations. The observed differences are discussed considering the different analytical depths of both methods. The dielectric measurements reveal that the structure of the plasma deposited films is different from that of the bulk material. Moreover, these measurements show also that the plasma deposited films are not thermally stable but undergo a post plasma chemical reaction during heating, where the reaction kinetics depends on DC.