PID: from material properties to outdoor performance and quality control counter measures

Berghold, J.; Koch, Simon; Pingel, S.; Janke, Stefan; Ukar, A.; Grunow, P.; Shioda, Tatsutoshi

doi:10.1117/12.2188464

Cited by 14 publications

(17 citation statements)

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“…Besides, understanding and mitigating PID receive growing attention and importance, due to the consistently increasing operational voltages in PV plants. Indeed, today, voltages of 1000 V and more between the grounded frame and the solar cell are not uncommon and they tend to become common practice [6][7][8][9][10].…”

Section: Introductionmentioning

confidence: 99%

Physics of potential-induced degradation in bifacial p-PERC solar cells

Carolus

Tsanakas

Heide

et al. 2019

Solar Energy Materials and Solar Cells

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The combination of increasing operational voltages beyond 1000 V in photovoltaic (PV) installations and the emergence of new PV technologies requires a critical assessment of the susceptibility to potential-induced degradation (PID). Since this failure mode can trigger significant and rapid power losses, it is considered among the most critical failure modes with a high financial impact. Insights in the physical mechanism of the performance loss and its driving factors are critical to develop adapted characterization methods and mitigation solutions. PID in p-type solar cells is triggered by sodium (Na) that diffuses into stacking faults of the silicon lattice, causing shunt paths through the pn-junction. In addition, it is hypothesised that for bifacial p-PERC solar cells positive charges, such as Na + , accumulate in/on the negatively charged AlO x rear passivation layer due to the potential difference between the glass and the rear cell surface. This significantly increases surface recombination. However, the degradation behaviour observed in bifacial monocrystalline p-PERC solar cells under PID stress from both sides (bifacial PID stress) does not match with just one of the degradation mechanisms. A comprehensive test matrix was carried out to understand the physical origin of PID in front emitter bifacial p-PERC solar cells in a glass/glass packaging. The results show that bifacial p-PERC solar cells under bifacial PID stress suffer from both shunting of the pn-junction and increased surface recombination at their rear side. Hereby, we prove that the glass/glass packaging in combination with bifacial solar cells can significantly increase the severity of PID.

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Section: Introductionmentioning

confidence: 99%

Physics of potential-induced degradation in bifacial p-PERC solar cells

Carolus

Tsanakas

Heide

et al. 2019

Solar Energy Materials and Solar Cells

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“…Shunting‐type PID can cause significant power loss and even total module failure . Potential‐induced degradation is believed to be caused by the diffusion of metal ions—largely, Na + from the front glass and encapsulation of the cell—that are driven into the silicon by the high voltage present . Currently, it is unclear whether sodium diffuses along stacking faults that are already present in the material or if sodium itself induces a stacking fault from a preexisting defect at the surface of the silicon .…”

Section: Introductionmentioning

confidence: 99%

Investigating PID shunting in polycrystalline silicon modules via multiscale, multitechnique characterization

Harvey

Moseley

Norman

et al. 2018

Progress in Photovoltaics

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VOLUME 26 • NUMBER 6 • JUNE 2018 RESEARCH AND APPLICATIONS wileyonlinelibrary.com/journal/progressinphotovoltaics PHOTOVOLTAICS Research and ApplicationsProgress in Photovoltaics offers a prestigious forum for reporting advances in this rapidly developing technology, aiming to reach all interested professionals, researchers and energy policy-makers.The key criterion is that all papers submitted should report substantial "progress" in photovoltaics.Papers are encouraged that report substantial "progress" such as gains in independently certified solar cell efficiency, eligible for a new entry in the journal's widely referenced Solar Cell Efficiency Tables.Examples of papers that will not be considered for publication are those that report development in materials without relation to data on cell performance, routine analysis, characterisation or modelling of cells or processing sequences, routine reports of system performance, improvements in electronic hardware design, or country programs, although invited papers may occasionally be solicited in these areas to capture accumulated "progress".Systems papers will only be considered in exceptional cases, such as where new developments in system applications have produced substantial progress in energy yield or reliability.Prospective authors are encouraged to consider the degree to which their contributions report significant progress in the field and to consider other means of publication for those not meeting the high standard required by Progress in Photovoltaics.

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“…Modules can be tested under both polarities and basic levels were chosen such that modules that do not degrade in test will not degrade in a subtropical environment. [ 110–112 ]…”

Section: Pid Testing Methodsmentioning

confidence: 99%

“…A soiled surface shows a lower glass sheet resistance which results in higher leakage current and PID risk. [ 128,156–158 ] This is more pronounced for humidity >55% and Hacke et al have demonstrated an impact of the type of soil on the resulting glass sheet resistance for various humidity levels. [ 158 ] A greater PID‐s impact can occur near the bottom edge of the modules in the field where dirt tends to accumulate.…”

Section: Pid‐impacting Factors and Limitation Solutionsmentioning

confidence: 99%

Review of Potential‐Induced Degradation in Bifacial Photovoltaic Modules

Molto

Mahmood

et al. 2023

Energy Tech

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Bifacial modules are increasingly deployed in the field and are expected to represent half of the market share within 10 years. Their rear structure differs from monofacial modules to allow additional light absorption. However, it brings new reliability challenges to address. In particular, the risk of potential‐induced degradation (PID) is increased as both module sides are impacted. Different PID processes have been identified in the literature: shunting type (PID‐s), polarization type (PID‐p), Na penetration type, and corrosion type (PID‐c). Their occurrence depends on the photovoltaic system configuration as well as the module's materials. Apart from PID‐s, PID processes are not well understood and extensive research is needed to elucidate the PID scenario and underlying mechanisms. Herein, current knowledge about PID processes and their impact on the main bifacial modules in the market are gathered with the aim to guide future research. Bifacial module technologies and leakage current paths leading to PID are described. Indoor and outdoor PID testing methods are detailed. For each bifacial module technology, the PID processes are investigated with their indicators, mechanism and recovery process. PID‐impacting factors and limitation solutions are finally reported and a state of the art on PID modeling is presented.

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PID: from material properties to outdoor performance and quality control counter measures

Cited by 14 publications

References 0 publications

Physics of potential-induced degradation in bifacial p-PERC solar cells

Physics of potential-induced degradation in bifacial p-PERC solar cells

Investigating PID shunting in polycrystalline silicon modules via multiscale, multitechnique characterization

Review of Potential‐Induced Degradation in Bifacial Photovoltaic Modules

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