2016
DOI: 10.1515/nuka-2016-0024
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Plasma characterization of the gas-puff target source dedicated for soft X-ray microscopy using SiC detectors

Abstract: Abstract. An Nd:YAG pulsed laser was employed to irradiate a nitrogen gas-puff target. The interaction gives rise to the emission of soft X-ray (SXR) radiation in the 'water window' spectral range ( = 2.3÷4.4 nm). This source was already successfully employed to perform the SXR microscopy. In this work, a Silicon Carbide (SiC) detector was used to characterize the nitrogen plasma emission in terms of gas-puff target parameters. The measurements show applicability of SiC detectors for SXR plasma characterizati… Show more

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Cited by 8 publications
(4 citation statements)
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“…The advantage to employ this gaseous source to produce extreme ultra violet (EUV) and soft X-rays (SXR) are different, such as the small maintenance costs as well as the compact construction and the possibilities to perform experiments in a laboratory environment producing a "debris free" plasma, at a density lower than the critical one. Other advantages of the gas-puff source are mentioned in [9]. The suitability of high-quality epitaxial layers allows the fabrication of high-performance SiC detectors based on Schottky diodes and p-n junctions [10].…”
mentioning
confidence: 99%
“…The advantage to employ this gaseous source to produce extreme ultra violet (EUV) and soft X-rays (SXR) are different, such as the small maintenance costs as well as the compact construction and the possibilities to perform experiments in a laboratory environment producing a "debris free" plasma, at a density lower than the critical one. Other advantages of the gas-puff source are mentioned in [9]. The suitability of high-quality epitaxial layers allows the fabrication of high-performance SiC detectors based on Schottky diodes and p-n junctions [10].…”
mentioning
confidence: 99%
“…The presented SiC detectors can be employed to monitor plasma produced from compact laboratory sources and from large facilities such as accelerators and for transport of charge particle beams. They can be employed to analyze the ion-gas and ion-thin foil interactions in stripper systems producing SXR emission, for RBS, ERDA, NRA, and PIXE analysis, for electron and ion detection in the time-of-flight configuration, and for spectroscopy, monitoring the production of characteristic x-ray emission, as reported widely in the literature [6,7,8,9,[11][12][13][14][15][16]21]. SiC detectors present a significant advantage with respect to the traditional Si detector, due to the higher-energy band gap, which makes the detector less sensitive to the VIS light produced by the laserproduced plasma.…”
Section: Discussionmentioning
confidence: 99%
“…More details about the source employed are described in Refs. [19][20][21]. An AXUV-HS1 Si photodiode (mentioned in the paper as HS1) from IRD, USA, with an active area of 0.05 mm 2 and a capacitance of 20 pF, and a SiC detector, with an active area of 6.35 mm 2 and a junction capacitance of 100 pF, were placed at a distance of 108 and 170 mm, respectively, from the gas-puff source.…”
Section: Methodsmentioning
confidence: 99%
“…Their higher gap energy of 3.3 eV blinds them to visible light, but not to UV and X-rays, their leakage current is of the order of 1 pA at room temperature, they can also operate at high temperature and their radiation damage occurs at high doses. Other SiC properties and construction aspects are given in the literature [20,21]. SiCs are connected in time-of-flight (TOF) configuration in order to give the ion energy using the known flight distance and the recording of the spectra on a fast storage oscilloscope.…”
Section: Jinst 15 C03056mentioning
confidence: 99%