2020
DOI: 10.1021/acs.jpcc.0c04223
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Plasma-Enhanced Atomic Layer Deposition of Cobalt and Cobalt Nitride: What Controls the Incorporation of Nitrogen?

Abstract: The present study covers the processes that govern the incorporation of nitrogen in the film during atomic layer deposition (ALD) of cobalt and cobalt nitride prepared from cobaltocene (CoCp 2 ) and NH 3 plasma. It is demonstrated that nitrogen incorporation is strongly temperature-dependent; at temperatures of 260 °C and below, the deposited films consist primarily of Co 2 N, whereas increasing the temperature to 300 °C leads to a mixture of Co 3 N and Co, and at 350 °C, nominally pure Co is obtained. The sam… Show more

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Cited by 10 publications
(13 citation statements)
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“…These trench N species on Co(100) surface will be a potential source of N impurities in deposited Co thin films. 30,45…”
Section: Discussionmentioning
confidence: 99%
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“…These trench N species on Co(100) surface will be a potential source of N impurities in deposited Co thin films. 30,45…”
Section: Discussionmentioning
confidence: 99%
“…Finally, if the temperature is up to 623 K, the deposited thin film is nominally pure Co, which is due to the decomposition of cobalt nitride. 30 Detailed studies are needed to unravel the formation of surface cobalt nitride and removal of these N species, which is out of the scope of this work.…”
Section: Discussionmentioning
confidence: 99%
See 3 more Smart Citations