2002
DOI: 10.1116/1.1481044
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Plasma etching of SiC surface using NF3

Abstract: NF 3 was applied in the reactive ion etching of SiC. The effects of rf power and NF3 pressure on the etching rate and the surface morphology were investigated by means of scanning electron microscopy and atomic force microscopy. A procedure for getting the smooth and residue-free etched surface of SiC with a high etching rate of 87 nm/min was obtained under the conditions such as rf power of 100 W and NF3 pressure ranging from 0.5 to 1 Pa. A rough surface with spikes was obtained under the NF3 pressures higher… Show more

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Cited by 28 publications
(12 citation statements)
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“…Compared with CF 3 etching Si [15], the similar reaction layer is formed through which Si atoms are etched. This phenomenon is also observed by experiment [27].…”
Section: Discussionsupporting
confidence: 79%
“…Compared with CF 3 etching Si [15], the similar reaction layer is formed through which Si atoms are etched. This phenomenon is also observed by experiment [27].…”
Section: Discussionsupporting
confidence: 79%
“…There are a few reports using Cl 2 [45] and HBr [46], but the majority of the research in this area has focused on the use of fluorinated plasmas such as NF 3 [47], SF 6 [48], CHF 3 [49], CF 4 [50], and CBrF 3 [43]. Three of these gases (NF 3 , SF 6 , and CHF 3 ) were investigated to etch a-SiC using an Applied Materials P5000 RIE system equipped with a magnetically enhanced (ME) chamber.…”
Section: Etching Of Silicon Carbide Thin Filmsmentioning
confidence: 98%
“…3.5. Plasma etching of SiC surface using NF 3 [46,47] Silicon carbide (SiC) is a highly promising semiconductor material for use in high-temperature and high-power electronicdevice applications such as automotive and aircraft engine monitoring microwave communications, thin-film transistor technology, light sensors, solar cells, and diagnostic medical imaging. This is because of the attractive properties of SiC, such as a wide band gap (2.3 eV) at 300 K, a high thermal conductivity (5 W/cm 8C), its high breakdown electric field (3.0 Â 10 6 V/cm), and high saturated electron-drift velocity (2.70 Â 10 7 cm/s).…”
Section: Preparation Of Carbonaceous Thin Film By C 2 H 4 /Nf 3 Glow mentioning
confidence: 99%