2013
DOI: 10.1051/epjpv/2013018
|View full text |Cite
|
Sign up to set email alerts
|

Plasma immersion ion implantation of boron for ribbon silicon solar cells

Abstract: In this work, we report for the first time on the solar cell fabrication on n-type silicon RST (for Ribbon on Sacrificial Template) using plasma immersion ion implantation. The experiments were also carried out on FZ silicon as a reference. Boron was implanted at energies from 10 to 15 kV and doses from 10 15 to 10 16 cm −2 , then activated by a thermal annealing in a conventional furnace at 900 and 950• C for 30 min. The n + region acting as a back surface field was achieved by phosphorus spin-coating. The fr… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2014
2014
2015
2015

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(2 citation statements)
references
References 1 publication
0
2
0
Order By: Relevance
“…This is not the case for boron emitters performed by beamline (with pure B + ions). It is to be noted that other reported works on BF 3 plasma doping applied on float zone and ribbon silicon substrates, for similar dose ranges, also showed implied V oc quite below 600 mV but with lower thermal budgets . Two hypotheses (possibly combined) could explain the low V oc phenomenon: A degradation of the bulk substrate lifetime (because of extra‐contamination, enhanced during the high thermal annealing, or because of another physicochemical phenomenon linked to the co‐implantation of fluorine), A passivation issue at the surface (residual defects zone and/or bad interfacial oxide).…”
Section: Improvements Of Dose/annealing Conditionsmentioning
confidence: 76%
“…This is not the case for boron emitters performed by beamline (with pure B + ions). It is to be noted that other reported works on BF 3 plasma doping applied on float zone and ribbon silicon substrates, for similar dose ranges, also showed implied V oc quite below 600 mV but with lower thermal budgets . Two hypotheses (possibly combined) could explain the low V oc phenomenon: A degradation of the bulk substrate lifetime (because of extra‐contamination, enhanced during the high thermal annealing, or because of another physicochemical phenomenon linked to the co‐implantation of fluorine), A passivation issue at the surface (residual defects zone and/or bad interfacial oxide).…”
Section: Improvements Of Dose/annealing Conditionsmentioning
confidence: 76%
“…Plasma immersion ion implantation (PIII) was used in this study to enhance performance [18][19][20]. The target received substantial negative pulse voltage, and plasma was formed by the RF power in the cavity.…”
Section: Introductionmentioning
confidence: 99%