2013
DOI: 10.1364/oe.21.00a786
|View full text |Cite
|
Sign up to set email alerts
|

Plasmonic silicon solar cells: impact of material quality and geometry

Abstract: Abstract:We study n-i-p amorphous silicon solar cells with lightscattering nanoparticles in the back reflector. In one configuration, the particles are fully embedded in the zinc oxide buffer layer; In a second configuration, the particles are placed between the buffer layer and the flat back electrode. We use stencil lithography to produce the same periodic arrangement of the particles and we use the same solar cell structure on top, thus establishing a fair comparison between a novel plasmonic concept and it… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
11
0

Year Published

2013
2013
2017
2017

Publication Types

Select...
3
2
1

Relationship

0
6

Authors

Journals

citations
Cited by 30 publications
(11 citation statements)
references
References 42 publications
0
11
0
Order By: Relevance
“…Subsequently, to calculate the free electron density and free hole density, Poisson's Equation is used: (6) Shockley Read Hall recombination rate (7)(8)(9)(10)(11) [42,43] (15) where ϕ (Electric Potential), p (Hole concentration), and n (Electron concentration) are variables, q (Electron charge), ε (Optical property of the material), c (Initial value for carrier concentration), n i (intrinsic concentration), τ n (Electron life time), τ p (Hole life time), φ 0 (incident photon flux), α, (absorption coefficient of material), μ n (Electron mobility), μ p (Hole mobility), and D n (Electron Diffusivity) are constants.…”
Section: Conflict Of Interestmentioning
confidence: 99%
See 1 more Smart Citation
“…Subsequently, to calculate the free electron density and free hole density, Poisson's Equation is used: (6) Shockley Read Hall recombination rate (7)(8)(9)(10)(11) [42,43] (15) where ϕ (Electric Potential), p (Hole concentration), and n (Electron concentration) are variables, q (Electron charge), ε (Optical property of the material), c (Initial value for carrier concentration), n i (intrinsic concentration), τ n (Electron life time), τ p (Hole life time), φ 0 (incident photon flux), α, (absorption coefficient of material), μ n (Electron mobility), μ p (Hole mobility), and D n (Electron Diffusivity) are constants.…”
Section: Conflict Of Interestmentioning
confidence: 99%
“…For instance, applying a randomly textured layer inside the device is a standard approach to gain more effective scattered rays inside the device [2][3][4][5]. Additionally, introducing a periodic structure as a reflector to enable the increase of light path inside the absorber [6][7][8]; thus enhancing light absorption. Alternatively, scientists have tried to utilize metallic nanoparticles (MNPs) to improve the cell efficiency upon creating a high-intensity localized fields around these MNPs [9][10][11], but unfortunately not much success has been reported yet.…”
Section: Introductionmentioning
confidence: 99%
“…They are designed for constructive interference. Random textured or corrugated external/internal interfaces are used to improve scattering , while transparent conductive oxide (TCO) layers are utilized to minimize reflections at interfaces, additionally highly reflective surfaces are used to enhance back reflections. Figure illustrates such enhancing techniques.…”
Section: Introductionmentioning
confidence: 99%
“…In fact, while previous conclusions have been screened by additional effects or were biased toward a particular approach [23,24,147,148] (with a corresponding loss of generality), using the simplest possible platform enabled me to make a clear and unbiassed comparison of these two light-trapping mechanisms.…”
Section: Discussionmentioning
confidence: 99%