Polar scanning in multi-beam diffractometry

Abstract

A new method is developed for studying multi‐beam X‐ray diffraction in crystals. The method is based on simultaneous recording of the intensities of two Bragg‐reflected beams depending on the angle between the primary beam and the surface of a flat specimen. The primary beam is collimated in the plane of incidence, being divergent in the azimuthal plane. The method is tested on perfect and disturbed germanium single crystals for different four‐beam diffraction geometries. The obtained experimental and calculated data are in good agreement. The method seems to be promising for the experimental determination of structure‐factor phases.