2007
DOI: 10.1063/1.2405014
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Polarity and piezoelectric response of solution grown zinc oxide nanocrystals on silver

Abstract: The crystal orientation and piezoelectric properties of solution grown ZnO nanorods on Ag films were measured by quantitative piezoelectric force microscopy (PFM). The polarity of the rods, important for many device applications, was determined to be oriented [0001] from the substrates. This indicates that the prevalence of the [0001] oriented crystals is dominated by the fastest growing direction in solution. The average value of the d33 piezoelectric coefficient was measured to be 4.41pm∕V, with a standard d… Show more

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Cited by 71 publications
(68 citation statements)
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“…[28][29][30][31] Indeed, recently several PFM investigations on ZnO nanostructures and thin films have been carried out. [32][33][34][35] Here, we present PFM experiments on both undoped and Co-doped ZnO thin films, aiming at investigating the spatial distribution of the out-of-plane piezoelectric matrix element d 33 , which measures the material displacement in the same direction as the applied out-of-plane electric field.…”
Section: Introductionmentioning
confidence: 99%
“…[28][29][30][31] Indeed, recently several PFM investigations on ZnO nanostructures and thin films have been carried out. [32][33][34][35] Here, we present PFM experiments on both undoped and Co-doped ZnO thin films, aiming at investigating the spatial distribution of the out-of-plane piezoelectric matrix element d 33 , which measures the material displacement in the same direction as the applied out-of-plane electric field.…”
Section: Introductionmentioning
confidence: 99%
“…238 PFM imaging and local d 33 measurements have also been measured for large-order arrays 239 and individual nanorods of ZnO. 240 In 2008, Scrymgeour and Hsu reported combined PFM and conducting-AFM measurements of ZnO nanorods (Fig. 8), finding that d 33 was higher for more resistive nanorods.…”
Section: Pfm Of Gan and Ainmentioning
confidence: 99%
“…241 Previously, based on nanorod measurements (d 33 = 4.41 ± 1.73 pm/V), Scrymgeour et al reported that PFM measurements were not correlated with height and exhibited weak linear correlation with diameter. 240 PFM has also been used to investigate the piezoelectric properties of sputtered, 242,243 and sol-gel 244 prepared thin films. Schuler et al reported high-resolution inversion domain boundaries on the order of 1.5 nm in sputtered ZnO thin films.…”
Section: Pfm Of Gan and Ainmentioning
confidence: 99%
“…For example, Wang and Song [17] has synthesized aligned ZnO nanowire arrays and has characterized their electrical energy generation via deformation induced by an atomic force microscope tip. Scrymgeour et al [19] has employed a solution technique for growing ZnO nanorods on silver films, and piezoelectric force microscopy studies estimate that the d 33 constants of individual nanorods are approximately 4.41 ± 1.73 pm V -1 . On the other hand, Lin et al [20] has fabricated a PZT/ZnO nanowhisker nanocomposite; when compared to monolithic PZT, although the piezoelectric constant of the nanocomposite decreased slightly, the nanocomposite's flexural strength and fracture toughness increased by 40 and 30%, respectively.…”
Section: Introductionmentioning
confidence: 99%