1997
DOI: 10.1111/j.1151-2916.1997.tb02792.x
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Polarization Dependence of the Cr3+ R‐Line Fluorescence from Sapphire and Its Application to Crystal Orientation and Piezospectroscopic Measurement

Abstract: unless microfocus facilities are available. One motivation of The room-temperature polarization characteristics of the the present study is to develop a technique to determine the ruby R lines have been studied by monitoring the fluorescrystallographic orientation of small regions of Al 2 O 3 by studycence intensity as a function of excitation direction relative ing the polarization characteristics of their R-line fluorescence. to the crystallographic axes of the ruby crystal. The R linesAdditionally, precise … Show more

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Cited by 59 publications
(29 citation statements)
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“…This behaviour can be used to calculate the residual stresses in the alumina phase from the values of the piezospectroscopic tensors, ij , as determined by He and Clarke. 19 They are diagonal with respect to the ruby crystallographic axes. Assuming that the piezo-spectroscopic effect is isotropic in the alumina basal plane, 11 ≈ 22 , the peak shift ν between the stressed and unstressed ruby is given for the two R 1 and R 2 lines by: where σ ii (i = 1, 2, 3) stand for stress components along the a-, m-and c-axes of the hexagonal sapphire lattice, respectively.…”
Section: Residual Stressesmentioning
confidence: 99%
“…This behaviour can be used to calculate the residual stresses in the alumina phase from the values of the piezospectroscopic tensors, ij , as determined by He and Clarke. 19 They are diagonal with respect to the ruby crystallographic axes. Assuming that the piezo-spectroscopic effect is isotropic in the alumina basal plane, 11 ≈ 22 , the peak shift ν between the stressed and unstressed ruby is given for the two R 1 and R 2 lines by: where σ ii (i = 1, 2, 3) stand for stress components along the a-, m-and c-axes of the hexagonal sapphire lattice, respectively.…”
Section: Residual Stressesmentioning
confidence: 99%
“…At least part of the motivation for the polycrystalline research was to investigate the stress fields arising in polycrystalline alumina responsible for microcracking-the spontaneous localized cracking that occurs in polycrystalline alumina on cooling as a consequence of the anisotropic structure and thermal expansion of corundum [39][40][41]. From the 1990s onward, although there were many notable fundamental studies of the phenomenon [42][43][44][45][46][47][48][49][50][51][52][53][54][55][56][57][58], the shift in energy of R lines with stress was largely confined to the applied domain, detailed in numerous works, such as: measurement of stress in bulk Al2O3 polycrystals [42,[58][59][60][61][62][63][64][65][66][67]; in bulk Al2O3-ZrO2 composites [68][69][70][71][72][73][74][75][76][77][78]; in sapphire or composite fibers, free or in matrices [79][80]…”
mentioning
confidence: 99%
“…The peak height ratio of the R1 and R2 luminescence peaks (H R1 /H R2 ) can be used to determine whether there is preferential orientation in the polycrystalline a-Al 2 O 3 . The R lines are strongly polarized in the basal plane but have no preferred vibration direction within the basal plane [24]. Thus the peak intensity ratio is dependent on the orientation of the crystal [24].…”
Section: Preferential Crystallographic Orientationmentioning
confidence: 97%
“…The R lines are strongly polarized in the basal plane but have no preferred vibration direction within the basal plane [24]. Thus the peak intensity ratio is dependent on the orientation of the crystal [24]. Using a single crystal sapphire and a 59 objective lens, the peak height ratio (H R1 /H R2 ) was determined as 1.88 when the basal plane of the single crystal sapphire was placed facing (in normal to) the laser incidence direction (optical axis of the system).…”
Section: Preferential Crystallographic Orientationmentioning
confidence: 99%