Polarization Mixing Error Reduction in a Two-Beam Interferometer

Bitou, Youichi

doi:10.1007/s10043-002-0227-5

Cited by 5 publications

(4 citation statements)

References 8 publications

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“…It has been shown previously that two kinds of non-linearity exist in the Zeeman laser and heterodyne interferometers [12][13][14][15][16], namely errors arising from frequency mixing [16][17][18] and errors from polarization mixing [19]. Frequency mixing errors are the predominant form of non-linear errors in a heterodyne interferometer.…”

Section: Error Analysismentioning

confidence: 98%

“…Frequency mixing errors are the predominant form of non-linear errors in a heterodyne interferometer. These errors are induced primarily from elliptical polarization, non-orthogonality of the polarization radiations and an imperfect alignment of either the polarization beam splitter (PBS) or of the wave plate [19]. The polarization mixing errors tend to be smaller than the frequency mixing error, and arise from leakage at the PBS and by the modification of the polarization states in the arms of the interferometers which occurs either as a result of the cube corner reflector in each arm or because of imperfect or misorientated optical elements such as the wave plates [19].…”

Section: Error Analysismentioning

confidence: 99%

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Measurements of phase retardation and principal axis angle using an electro-optic modulated Mach–Zehnder interferometer

Lee

Lin

2005

Optics and Lasers in Engineering

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Section: Error Analysismentioning

confidence: 98%

Section: Error Analysismentioning

confidence: 99%

Measurements of phase retardation and principal axis angle using an electro-optic modulated Mach–Zehnder interferometer

Lee

Lin

2005

Optics and Lasers in Engineering

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“…In our proposed system, SPM is utilized to maintain the modulation index at a constant value, and the Mach-Zehnder interferometer can eliminate the polarization mixing error [16]. The measurement system is shown in figure 1.…”

Section: Displacement-measuring Mach-zehnder Interferometermentioning

confidence: 99%

Iodine-frequency-stabilized laser diode and displacement-measuring interferometer based on sinusoidal phase modulation

Duong

Higuchi

et al. 2018

Meas. Sci. Technol.

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We propose a sinusoidal phase modulation method to achieve both the frequency stabilization of an external-cavity laser diode (ECLD) to an 127I2 saturated absorption transition near 633 nm and displacement measurement using a Mach–Zehnder interferometer. First, the frequency of the ECLD is stabilized to the b21 hyperfine component of the P(33) 6-3 transition of 127I2 by combining sinusoidal phase modulation by an electro-optic modulator and frequency modulation spectroscopy by chopping the pump beam using an acousto-optic modulator. Even though a small modulation index of m = 3.768 rad is utilized, a relative frequency stability of 10−11 order is obtained over a sampling time of 400 s. Secondly, the frequency-stabilized ECLD is applied as a light source to a Mach–Zehnder interferometer. From the two consecutive modulation harmonics (second and third orders) involved in the interferometer signal, the displacement of the moving mirror is determined for four optical path differences (L0 = 100, 200, 500, and 1000 mm). The measured modulation indexes for the four optical path differences coincide with the designated value (3.768 rad) within 0.5%. Compared with the sinusoidal frequency modulation Michelson interferometer (Vu et al 2016 Meas. Sci. Technol. 27 105201) which was demonstrated by some of the same authors of this paper, the phase modulation Mach–Zhender interferometer could fix the modulation index to a constant value for the four optical path differences. In this report, we discuss the measurement principle, experimental system, and results.

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“…The second harmonic error (SHE) [19,20] , the polarization mixing error (PME) [17,19,20] , the angular resolution of lock-in amplifier (ARLIA), the imperfection on light-path alignment, and the grating period error (GPE) all affected Δδ terr . The SHE was caused by small angular deviations of the transmission axes of POL or analyzers.…”

mentioning

confidence: 99%

Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry

Hsieh

Lin²,

Cheng

2016

中国光学快报

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This Letter presents a method of an optical sensor for measuring wavelength shifts. The system consists of a diffraction grating and a total internal reflection heterodyne interferometer. As a heterodyne light beam strikes a grating, the first-order diffraction beam is generated. The light penetrates into a total internal reflection prism at an angle larger than the critical angle. A wavelength variation will affect the diffractive angle of the first-order beam, thus inducing a phase difference variation of the light beam emerging from the total internal reflections inside the trapezoid prism. Both the experimental and theoretical results reveal that, for the first-order diffractive beam, the sensitivity and resolution levels are superior to 5°/nm and 0.006 nm, respectively, in the range of wavelength from 632 to 634 nm, and are superior to 3.1°/nm and 0.0095 nm in the range from 632 to 637 nm. For the theoretical simulation of the fourth-order diffractive beam, they are superior to 6.4 deg ∕nm and 0.0047 nm in the range from 632 to 637 nm.OCIS codes: 120.3180, 050.0050. doi: 10.3788/COL201614.081202.The accurate measurement of a wavelength shift plays a crucial role in many research fields, such as pressure sensing [1] , temperature sensing [2] , optical fiber communication [3] , and monochromatic interferometer applications. Especially in monochromatic interferometers, the basic Michelson interferometer consists of a monochromatic light source, a beam splitter (BS), and two mirrors. It relies on the principle of constructive and destructive interference as one mirror is fixed and the other is moved. It is indispensable to measure the wavelength variations [4] of a light source to ensure the measurement resolution. Therefore, the technique of optical sensors for measuring a small wavelength shift is becoming important [5] . In addition, the measurement methods of wavelength shifts are extensive. Several methods, including passive detection, diffraction type, and interferometric phase detection schemes, have been proposed to monitor the wavelength differences [6][7][8][9][10][11][12][13][14][15][16] . The passive detection system divides the scattered light from a Bragg grating into two parts, one of which is filtered in proportion to its wavelength, while the other is employed as a reference to compensate for intensity variations. The diffraction-type schemes evaluate the wavelength difference by an intensity variation of the first-order diffraction light beam from a diffraction grating. However, the measurement accuracy of these methods may be decreased because of the surrounding light and the scattered light interfering with the associated light [16] . Conversely, our interferometric phase detection scheme can detect the wavelength based on the measurement of phase variation and does not have these two aforementioned shortcoming [16] . This study demonstrates a total internal reflection (TIR) heterodyne interferometric sensor for measuring wavelength shifts and derives theoretical equations. The experimental ...

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Polarization Mixing Error Reduction in a Two-Beam Interferometer

Cited by 5 publications

References 8 publications

Measurements of phase retardation and principal axis angle using an electro-optic modulated Mach–Zehnder interferometer

Measurements of phase retardation and principal axis angle using an electro-optic modulated Mach–Zehnder interferometer

Iodine-frequency-stabilized laser diode and displacement-measuring interferometer based on sinusoidal phase modulation

Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry

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