We measure the infrared (wavelength λ = 11 -0.8 μm; energy E = 0.1 -1.5 eV) Faraday rotation and ellipticity in GaAs, BaF 2 , LaSrGaO 4 , LaSrAlO 4 , and ZnSe. Since these materials are commonly used as substrates and windows in infrared magneto-optical measurements, it is important to measure their Faraday signals for background subtraction. These measurement also provide a rigorous test of the accuracy and sensitivity of our unique magneto-polarimetry system. The light sources used in these measurements consist of gas and semiconductor lasers, which cover 0.1 -1.3 eV, as well as a custom-modified prism monochromator with a Xe lamp, which allows continuous broadband measurements in the 0.28 -1.5 eV energy range. The sensitivity of this broad-band system is approximately 10 μrad. Our measurements reveal that the Verdet coefficients of these materials are proportional to λ -2 , which is expected when probing with radiation energies below the band gap. Reproducible ellipticity signals are