Possible errors in energy dispersive x-ray spectrometry due to Raman scattering

Espen, Pierre J. Van; Nullens, H.; Adams, Fred C.

doi:10.1021/ac50045a054

Cited by 3 publications

(2 citation statements)

References 8 publications

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“…In XRF analysis, when monochromatic x-rays are employed as exciting beams, the coexistence of fluorescent and RRS x-ray peaks may occur. This fact has been already recognized by Van Espen et al [38] in an early study using a Mo secondary target in a tubeexcited XRF. They concluded that the resonant, as well as the nonresonant, Raman bands are capable of restricting the accuracy of trace-element analysis in the vicinity of the scattered exciting x-ray beam.…”

Section: Discussionmentioning

confidence: 58%

Measurement of KL and LM resonant Raman scattering cross sections with a proton-induced x-ray beam

Karydas¹,

Paradellis²

1997

J. Phys. B: At. Mol. Opt. Phys.

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The resonant Raman effect has been described as an inelastic scattering process occurring when the energy of the exciting x-ray beam approaches from below the energy of an absorption edge of a target element. It produces a scattered photon with a characteristic maximum energy and the emission of an inner-shell electron. A high monochromatic CrK α x-ray beam produced by protons was utilized for the measurement of the KL type of resonant Raman scattering (RRS) cross sections in V and Cr and of the LM ones in La and Ce. In the case of V and Cr targets, the fluorescence yields of the KL-RRS process were also extracted, while the fine-structure splitting in a LM-RRS spectrum was observed for the first time. The influence of RRS into different topics of x-ray spectrometry, like the quantitative x-ray flourescence analysis, the theoretical calculations of the mass attenuation coefficients or the shape of characteristic xrays emitted from low Z thick targets, is also discussed.

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Section: Discussionmentioning

confidence: 58%

Measurement of KL and LM resonant Raman scattering cross sections with a proton-induced x-ray beam

Karydas¹,

Paradellis²

1997

J. Phys. B: At. Mol. Opt. Phys.

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“…The data revealed that there was a high purity of Ag present in the powder. The presence of Si in the EDX could be an error due to possible Raman scattering [4], as shown by the less intense spike from the EDX graph. The presence of Cl, however, could be an inherent trace element in the produced powder.…”

Section: Morphological Characterizationmentioning

confidence: 99%

Highly sensitive determination of heavy metals in upland and lowland rice using AgNP/BiNP/MWCNT/nafion modified glassy carbon electrode via anodic stripping voltammetry

Palisoc

Chua

Natividad

2020

Mater. Res. Express

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It is of prime importance to determine the presence of trace heavy metals, especially cadmium (Cd2 + ) and lead (Pb2 + ) in rice to ensure food safety as it is the staple source of the daily caloric intake of Asians. This work utilized anodic stripping voltammetry (ASV) for the determination of heavy metals due to its portability for in situ measurements. A glassy electrode modified with silver nanoparticles (AgNP), bismuth nanoparticles (BiNP), multiwalled carbon nanotubes (MWCNT) and Nafion was fabricated to serve as the working electrode. The morphology of the fabricated electrode was characterized using scanning electron microscopy and x-ray diffraction, its elemental composition was determined by energy dispersive spectroscopy, its chemical bonds were identified using Fourier transform infrared spectroscopy, and its electrochemical behavior was measured via cyclic voltammetry. The electrode showed high stability at 50 continuous scans. The optimal deposition time, accumulation time and scan rate were determined to be 80 s, 60 s and 100 mV s−1, respectively. The detection limit for Cd2 + and Pb2 + were determined to be 25.12 ppb and 20.55 ppb, respectively. Rice samples were analyzed and the transfer factor of the heavy metals were determined at each isolated part. The ASV results were validated with atomic absorption spectroscopy.

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An in‐depth study of energy‐dispersive x‐ray spectra

1980

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A detailed study of energy‐dispersive X‐ray spectra is undertaken. Considerable attention is given to a method for a systematic and accurate description of the K and L spectra; a digital correction for the peak profile is evaluated. The following second order effects and spectral artefacts are investigated: radiative Auger transitions, spectral background components, Raman scattering of X‐rays, silicon escape, fluorescence of the detector materials, and sum peaks.

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Possible errors in energy dispersive x-ray spectrometry due to Raman scattering

Cited by 3 publications

References 8 publications

Measurement of KL and LM resonant Raman scattering cross sections with a proton-induced x-ray beam

Measurement of KL and LM resonant Raman scattering cross sections with a proton-induced x-ray beam

Highly sensitive determination of heavy metals in upland and lowland rice using AgNP/BiNP/MWCNT/nafion modified glassy carbon electrode via anodic stripping voltammetry

An in‐depth study of energy‐dispersive x‐ray spectra

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