Post annealing effect on structural and optical properties of ZnO thin films derived by sol–gel route

Singh, Amanpal; Kumar, Dinesh; Khanna, P. K.; Kumar, Mukesh; Prasad, B.

doi:10.1007/s10854-013-1451-4

Cited by 8 publications

(2 citation statements)

References 28 publications

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“…Since the grain sizes remain consistent at different annealing temperatures, as shown in Table 1 , this theory is not applicable in our case. Singh et al offered another hypothesis [ 23 ], that is, that the quality of ZnO film deteriorates at higher annealing temperatures due to the breakage of bonds and/or reaction with the substrate. We explore the breakage bond theory and illustrate its effect in Figure 5 .…”

Section: Resultsmentioning

confidence: 99%

RF Sputtering, Post-Annealing Treatment and Characterizations of ZnO (002) Thin Films on 3C-SiC (111)/Si (111) Substrates

et al. 2017

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We report on the radio frequency (RF) sputtering of c-axis oriented ZnO thin films on top of epitaxial 3C-SiC-on-Si (111) substrates, which were then subjected to post-annealing treatment at 400, 600 and 800 °C. Grazing incident X-ray Diffraction (XRD) data show that the Full Width Half Maximum (FWHM) values for O2/Ar ratios between 30% and 60% are consistent, with a mean of 0.325° and a standard deviation of 0.03°. This is largely attributed to the smaller lattice mismatch of 5% between the ZnO (002) and SiC (111) films. The quality of the ZnO films deteriorated at the post-annealing treatment of 800 °C, as demonstrated by the increasing value of FWHM diffraction peaks, the reducing value of the peak intensity, the reducing percentage of (002) oriented area under the curve, and the increasing value of biaxial stress. We propose a simple growth model to explain the result.

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Section: Resultsmentioning

confidence: 99%

RF Sputtering, Post-Annealing Treatment and Characterizations of ZnO (002) Thin Films on 3C-SiC (111)/Si (111) Substrates

et al. 2017

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“…In most reports published so far, it is obtained by using zinc acetate dihydrate (ZAD) as the salt and ethanolamine (EA) as the stabilizer. The increasing interest in the development of sol–gel ZnO inks is reflected by recent specific studies on the effect of solvents, , precursor nature and concentration, , EA/ZAD molar ratios, , sol aging, annealing duration, , annealing temperature, , and even specific process parameters such as withdrawal speed in deep coating on the properties of the resulting ZnO.…”

Section: Introductionmentioning

confidence: 99%

Role of Ethanolamine on the Stability of a Sol–Gel ZnO Ink

et al. 2017

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This work presents a detailed structural and chemical characterization of the system formed by zinc acetate dihydrate (ZAD) and ethanolamine (EA) with methoxyethanol (ME), in order to describe its stability. The origin of the mixture degradation during storage at room conditions is analyzed. Theoretical calculations of the frontier orbitals of the system ZAD plus EA under interaction with ME and CO 2 are used to deduce energy levels and stability of the different molecules appearing in the ZAD-EA-ME system. The models were tested as potential energy minimum and their photo-absorption spectra were simulated. The dimerization process leading from the simplest configuration to the most abundant one is also theoretically analyzed and used to describe the effect of the nuclearity raise on the mixture stability. Our results explain the experimental observations and provide a better understanding of the role played by EA in the formation of ZnO and, consequently, allow optimizing the technological processes to prepare these films.

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Fabrication and characterization of highly c-axial oriented ZnO films by chemical solution deposition

Tang

Chen

et al. 2014

J Mater Sci: Mater Electron

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Post annealing effect on structural and optical properties of ZnO thin films derived by sol–gel route

Cited by 8 publications

References 28 publications

RF Sputtering, Post-Annealing Treatment and Characterizations of ZnO (002) Thin Films on 3C-SiC (111)/Si (111) Substrates

RF Sputtering, Post-Annealing Treatment and Characterizations of ZnO (002) Thin Films on 3C-SiC (111)/Si (111) Substrates

Role of Ethanolamine on the Stability of a Sol–Gel ZnO Ink

Fabrication and characterization of highly c-axial oriented ZnO films by chemical solution deposition

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