“…In particular, and differently from many other works, we put a strong focus on the analysis and improvement in the metrological characteristics. In fact, it is clear how materials characterization methods at microwave frequencies were an evolving field in the last years: these techniques had great success in the experimental investigation of the e.m. properties of matter [ 64 , 65 , 66 , 67 , 68 ], and nowadays, microwave measurements are instrumental both for the design and testing of devices and complex systems whose performances can be particularly sensitive to the so-measured quantities [ 24 , 69 , 70 , 71 , 72 , 73 , 74 , 75 , 76 ] and in metrology [ 77 , 78 , 79 ]. This is the general framework into which this work fits: it shows a novel configuration of a dielectric-loaded resonator, and its possible applications, with a thorough evaluation of the measurement uncertainty.…”