2019
DOI: 10.1109/jphotov.2019.2937231
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Potential-Induced Degradation of Bifacial PERC Solar Cells Under Illumination

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Cited by 16 publications
(22 citation statements)
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“…However, our solution to the PID problem is combining an electronic device without crossing with the actual PV manufacturing. Therefore, the proposed device is expected to consume a small amount of energy, which is calculated using (3). The device has an applied voltage of 1000 V, and the current is limited to 20 mA.…”
Section: Comparative Studymentioning
confidence: 99%
See 1 more Smart Citation
“…However, our solution to the PID problem is combining an electronic device without crossing with the actual PV manufacturing. Therefore, the proposed device is expected to consume a small amount of energy, which is calculated using (3). The device has an applied voltage of 1000 V, and the current is limited to 20 mA.…”
Section: Comparative Studymentioning
confidence: 99%
“…Although PV modules have long been considered reliable under field conditions with low degradation and failure rates, they can be affected by diverse degradation mechanisms, which collectively reduce the module crop power over time. One of the main degradation mechanisms is called potential-inducted-degradation (PID) [1][2][3]. For many PV systems, PID is one of the leading causes of module degradation caused by the high voltage between the encapsulants and the front glass surface, which is grounded via the substructure of the cell or the frame [4].…”
Section: Introductionmentioning
confidence: 99%
“…More details are available in a comprehensive review presented by Luo et al [ 8 ] However, some more recent findings of the shunting‐type PID in p‐type c‐Si PV cell modules are presented in the present review. Recently, Sporleder et al [ 51–54 ] have reported corrosive PID at the rear side of bifacial PERCs. This kind of PID is not explained in the discussion of this section.…”
Section: Pid Phenomena In Conventional P‐type C‐si Pv Cell Modulesmentioning
confidence: 99%
“…Hacke et al [ 11 ] reported that the dissolution of SiN x antireflection/passivation films and the degradation of metallization are caused by PID stress. Sporleder et al [ 51–54 ] investigated corrosion‐type PID on the rear side of p‐type bifacial PERC solar cells. The corrosion of TCO layers and related degradation in thin‐film PV modules under bias application are well‐known phenomena.…”
Section: Corrosion‐type Pidmentioning
confidence: 99%
“…Nevertheless, there are numerous degradation mechanisms, and these collectively reduce the module output power over time. One of the main degradation mechanisms is called potential-inducted-degradation (PID) [1][2][3]. For many photovoltaic (PV) systems, PID is one of the leading causes of module degradation and is caused by voltage, as well as the interaction of this stress factor with temperature and humidity.…”
Section: Introductionmentioning
confidence: 99%