Power supply noise control in pseudo functional test

Zhang, Tengteng; Walker, D.M.H.

doi:10.1109/vts.2013.6548881

2013 IEEE 31st VLSI Test Symposium (VTS) 2013

DOI: 10.1109/vts.2013.6548881

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Power supply noise control in pseudo functional test

Tengteng Zhang

D.M.H. Walker²

Abstract: Abstract-Pseudo

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Cited by 16 publications

References 22 publications

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Impact of test compression on power supply noise control

Zhang

Walker

2015

2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)

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Power supply noise control in pseudo functional test

Abstract: Abstract-Pseudo

Cited by 16 publications

References 22 publications

Impact of test compression on power supply noise control

Impact of test compression on power supply noise control

Functional Broadside Test Generation Using a Commercial ATPG Tool

Compaction of a Functional Broadside Test Set through the Compaction of a Functional Test Sequence without Sequential Fault Simulation

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