2013 IEEE 10th International Conference on Power Electronics and Drive Systems (PEDS) 2013
DOI: 10.1109/peds.2013.6527218
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Predicting potential of 4H-SiC power devices over 10 kV

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Cited by 8 publications
(2 citation statements)
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“…The loss data for the theoretical SiC GTO has been calculated with the formulae from [1], and its active area was scaled to the size of the 4.5 kV Si IGCT. The loss data for the SiC diode has been computed with empirical formulae given in [21], and scaled to the size of the 4.5 kV Si diode. Note, that the 3.3 kV Si IGBT does not have the same chip area as the other two examples.…”
Section: Semiconductor Lossesmentioning
confidence: 99%
“…The loss data for the theoretical SiC GTO has been calculated with the formulae from [1], and its active area was scaled to the size of the 4.5 kV Si IGCT. The loss data for the SiC diode has been computed with empirical formulae given in [21], and scaled to the size of the 4.5 kV Si diode. Note, that the 3.3 kV Si IGBT does not have the same chip area as the other two examples.…”
Section: Semiconductor Lossesmentioning
confidence: 99%
“…As a result, the chip area of a SiC MOSFET is smaller when compared with a Si MOSFET device of similar voltage and current ratings. Therefore, SiC devices have reduced gate charge requirements which potentially allow them to be operated at higher frequencies [11, 12]. Resonant converters using SiC devices have already been employed, proving its high efficiency and results in very clean waveforms during zero‐voltage switching (ZVS) at frequencies of several MHz [13–16].…”
Section: Introductionmentioning
confidence: 99%