2014
DOI: 10.1016/j.tsf.2014.11.053
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Prediction of defective regions in optimisation of surface textures in thin-film silicon solar cells using combined model of layer growth

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Cited by 25 publications
(26 citation statements)
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“…The aspect ratio here was chosen to have both efficient light trapping and good electrical performance in solar cells. As revealed by previous studies, the optimal correlation length is correlated with the cell thickness and aspect ratio . Thus, a careful optimization of correlation length (or pitch for periodic structures) and aspect ratio is necessary to obtain the best efficiency for a given cell thickness.…”
Section: Resultsmentioning
confidence: 90%
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“…The aspect ratio here was chosen to have both efficient light trapping and good electrical performance in solar cells. As revealed by previous studies, the optimal correlation length is correlated with the cell thickness and aspect ratio . Thus, a careful optimization of correlation length (or pitch for periodic structures) and aspect ratio is necessary to obtain the best efficiency for a given cell thickness.…”
Section: Resultsmentioning
confidence: 90%
“…The aspect ratio here was chosen to have both efficient light trapping and good electrical performance in solar cells. As revealed by previous studies, the optimal correlation length is correlated with the cell thickness and aspect ratio [16,32,[34][35][36]. Thus, a careful optimization of correlation Table I.…”
Section: Optimization Of Micro-textured Glass For Nc-si:h Solar Cellsmentioning
confidence: 92%
“…Furthermore, the electrical properties of the solar cell are negatively affected. Voids or cracks are formed in the µc‐Si:H film, leading to a drop of the open circuit voltage and fill factor . If the period is larger than the solar cell thickness, the light is diffracted in smaller diffraction angles, resulting in a drop of the short circuit current.…”
Section: Resultsmentioning
confidence: 99%
“…This result is in good agreement with earlier observations. [8][9][10]25,27 Considering the σ rms of A-0 (158 nm) and B-80 (200 nm), the formation of defective regions is apparently not so much dependent on σ rms , but more on the slope distributions of the substrates.…”
Section: Nc-si:h Film Growth and Defective Region Formationmentioning
confidence: 99%