2014
DOI: 10.1016/j.elecom.2014.08.026
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Prediction of photovoltaic p–n device short circuit current by photoelectrochemical analysis of p-type CIGSe films

Abstract: The quality control of individual semiconductor thin films during fabrication of multiple layers is important for industry and academia. The ultimate aim of this research is to predict the efficiency of p-n junction solar cells by photoelectrochemical analysis of the bare p-type semiconductor. A linear correlation between the photocurrent measured electrochemically on Cu(In,Ga)Se 2 absorber layers through a Eu 3+ electrolyte junction and short circuit current and efficiency of the corresponding solid state dev… Show more

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Cited by 15 publications
(14 citation statements)
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“…PEC transients of the CIS films were recorded by holding the absorbers at −0.4 V vs. Ag/AgCl reference in a 0.2 M aqueous Eu 3+ solution, employing a three-electrode setup described previously 66 . Illumination was supplied by a 530 nm light-emitting diode (Thorlabs), subject to an asymmetric square-wave duty cycle.…”
Section: Methodsmentioning
confidence: 99%
“…PEC transients of the CIS films were recorded by holding the absorbers at −0.4 V vs. Ag/AgCl reference in a 0.2 M aqueous Eu 3+ solution, employing a three-electrode setup described previously 66 . Illumination was supplied by a 530 nm light-emitting diode (Thorlabs), subject to an asymmetric square-wave duty cycle.…”
Section: Methodsmentioning
confidence: 99%
“…In Figure A, we can see that the higher photoactivity is achieved for the TT 300 °C/3 h film, which also showed different electrochemical behavior. This higher photocurrent can be correlated not only to a better photoactivity toward hydrogen gas production, but also to higher solar cell efficiency if a photovoltaic device is constructed with this film, as demonstrated by Colombara et al . for Cu(In,Ga)Se 2 thin films.…”
Section: Resultsmentioning
confidence: 99%
“…The photocurrent was doubled by etching with potassium cyanide for 60 s, reaching an EQE(530 nm) of 5%. This is a very common phenomenon for chalcogenide semiconductor films, and is likely related to the removal of conductive Cu-Se phases from the surface acting as preferential paths for recombination of the charge carriers [31]. Subsequent etching steps with hydrochloric acid reduced the photocurrent, but modified the photocurrent transient substantially (i.e.…”
Section: Photoelectrochemical Characterizationmentioning
confidence: 99%
“…Photoelectrochemical characterization (PEC) of selenized samples were performed with a set-up described in [31] aqueous electrolyte as the electron scavenging species. The film was subject to several consecutive etching treatments with 5 wt% potassium cyanide (KCN, Sigma-Aldrich !…”
Section: Characterization Of the Filmsmentioning
confidence: 99%