1994
DOI: 10.1016/0011-2275(94)90215-1
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Predictive model for critical current density of Ag-sheathed Bi2Sr2Ca1Cu2O8 composite tapes with fabrication defects

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1994
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Cited by 15 publications
(2 citation statements)
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“…Inherent to OPIT-derived tapes where Bi(Pb)SCCO ceramics are enclosed in Ag sheaths is the problem of tape blistering (bubbling). This process is caused by gas release from the ceramic core during thermal processing and results in degradation of J c [2]. Only few papers have been reported where this problem has been considered [2,3,4] or mentioned [5].…”
Section: Introductionmentioning
confidence: 99%
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“…Inherent to OPIT-derived tapes where Bi(Pb)SCCO ceramics are enclosed in Ag sheaths is the problem of tape blistering (bubbling). This process is caused by gas release from the ceramic core during thermal processing and results in degradation of J c [2]. Only few papers have been reported where this problem has been considered [2,3,4] or mentioned [5].…”
Section: Introductionmentioning
confidence: 99%
“…This process is caused by gas release from the ceramic core during thermal processing and results in degradation of J c [2]. Only few papers have been reported where this problem has been considered [2,3,4] or mentioned [5]. Melt processing followed by phase decomposition and oxygen evolution was claimed as the main cause of blistering in Ag/Bi-2212 tapes.…”
Section: Introductionmentioning
confidence: 99%