Predictor-corrector latency insertion method for fast transient analysis of ill-constructed circuits

Abstract

This paper describes a predictor-corrector latency insertion method (LIM) for a fast transient analysis of an illconstructed circuit. First, the basic LIM algorithm and limitations of the method are described. Next, we propose the predictorcorrector LIM with a large value of fictitious latency for the illconstructed topologies. Finally, numerical results show that our proposed method is applicable and efficient for the fast simulation of the ill-constructed circuit.

Thin-Film Transistor Simulations With the Voltage-In-Current Latency Insertion Method

“…Then, VinC LIM is formed by substituting the voltage equation in (4) into (5) and solving the substituted equation for the I n+1 ij terms. The resulting current equation in VinC LIM is given by…”

“…predictor-corrector LIM [5], locally implicit LIM (LILIM) [6], alternating direction explicit-LIM (ADE-LIM) [7], and the voltage-in-current LIM (VinC LIM) [8]. These algorithms have been applied in a myriad of applications, including power supply networks [9]- [12], transmission lines [13], [14], electro-thermal analysis [15], I/O buffers [16], [17], phase-locked loops [18], and power electronic systems [19], [20].…”