PACS: 78.30.Fs; 78.66.Fd; 81.15.Hi Raman scattering and infrared absorption properties of RF-MBE grown AlGaAsN layers have been reported in order to investigate the microscopic lattice structures related with the nitrogen incorporation. Several new Raman modes of the Al-N bonds have been observed at 449, 500, and 650 cm --1 in the Raman spectra of AlGaAsN (Al: 18-100%, N: 2%) instead of the mode of Ga-N bonds. The results strongly indicated that most of the N atoms form the Al-N bonds in the AlGaAsN layers. The infrared absorption spectra of the AlGaAsN have shown clearly that the TO AlN mode appears at 500 cm --1 , instead of the TO GaN mode that appeared at 469 cm --1 in GaAsN. The peak shift and the broadening of the absorption peak of the TO AlN mode will be discussed in terms of variation of the statistical distributions of the Al n Ga 4--n N (n ¼ 0, 1, 2, 3, 4) tetrahedral unit structures with increasing the Al amount.