2006
DOI: 10.1016/j.tsf.2005.07.248
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Preferred orientations in polycrystalline SnO2 films grown by atmospheric pressure chemical vapor deposition

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Cited by 86 publications
(55 citation statements)
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“…Variation in the growth rate in polycrystalline samples as a function of thickness is often attributed to the crystallographic changes occurring in the films. 15 The dependence of both the film thickness and substrate temperature on crystallographic growth direction of SnO 2 was also found to be significant. The crystal structures in all cases were, however, the tetragonal cassiterite structure.…”
Section: Sem and Eds Analysismentioning
confidence: 87%
“…Variation in the growth rate in polycrystalline samples as a function of thickness is often attributed to the crystallographic changes occurring in the films. 15 The dependence of both the film thickness and substrate temperature on crystallographic growth direction of SnO 2 was also found to be significant. The crystal structures in all cases were, however, the tetragonal cassiterite structure.…”
Section: Sem and Eds Analysismentioning
confidence: 87%
“…The calculated size is 22.44 nm, which is in accordance with TEM studies. Preferred orientation of ZrC crystal was calculated with Haris method from the XRD results according to the following relationship [29,30]:…”
Section: Resultsmentioning
confidence: 99%
“…SnO 2 film is used in many applications, such as gas sensor [19] and transparent electrode [16]. Several chemical and physical methods, such as sol-gel [20], ultrasonic spray pyrolysis [21], chemical vapor deposition [22], pulsed laser deposition [23], and sputtering [24], have been used to prepare SnO 2 film. Among them, the reactive sputtering deposition has shown the advantages of controlling the crystalline orientation, growing temperatures, interfacial adhesion to the substrate, and density of the grown film.…”
Section: Introductionmentioning
confidence: 99%