Preparation and Characterisation of Silicon Nitride Membranes for Soft X-Ray Microscopy

Anastasi, P. A. F.; Burge, R. E.

doi:10.1007/978-3-540-46887-5_77

Cited by 2 publications

(2 citation statements)

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“…The specimen chamber was examined in the light microscope by phase contrast to ensure that a reasonable distribution of fibrils was present. Superimposed on the membrane was a replica of an EM finder grid enabling easy location of groups of myofibrils (Anastasi & Burge, 1992). X-ray microscopy was performed either on the King's College scanning transmission X-ray microscope (STXM) (Morrison et d., 1992) on the 5U2 undulator beamline at the SERC Daresbury Laboratory's Synchotron Radiation Source or the Stony Brook/NSLS STXM (Jacobsen et al, 1991) on the X1A undulator beamline at Brookhaven Laboratories (Buckley et al, 1989).…”

Section: Methodsmentioning

confidence: 99%

The effect of soft X‐radiation on myofibrils

Bennett

Foster

Buckley

et al. 1993

Journal of Microscopy

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Myofibrils, the contractile organelles from striated muscles, have been examined in the X-ray microscope to determine the effect of radiation on their function and structure. Using X-rays of energy 350-385 eV in the water window we find that after an exposure to 7.5 x 105photons/pm2 (calculated to give an absorbed dose of 20 000 Gy) the myofibrils will no longer contract. The use of the free radical scavenging agent, DMSO, gives some protection to the fibrils. It has also been found that after this much irradiation the fibrils lose up to 20% of their mass. Further substantial mass loss occurs on subsequent irradiation. After 25 times the loss-of-function exposure only 30% of the mass remains. Analysis of a series of images of the same myofibril covering this range of exposures shows that the mass is preferentially lost in some areas of the structure and consequently significant structural changes occur. 0 1993 The Royal Microscopical Society 109

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Section: Methodsmentioning

confidence: 99%

The effect of soft X‐radiation on myofibrils

Bennett

Foster

Buckley

et al. 1993

Journal of Microscopy

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“…The foils are prepared on 300 µm thick Si wafers 16 following the procedure of (Anastasi & Burge, 1990). The basic procedure starts by coating both sides 17 of a standard Si wafer with Si 3 N 4 .…”

Section: X-ray Analysis 14mentioning

confidence: 99%