2013
DOI: 10.1016/j.solener.2013.05.024
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Preparation and characterization of cost effective spray pyrolyzed absorber layer for thin film solar cells

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Cited by 24 publications
(9 citation statements)
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References 33 publications
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“…XRD analysis of stepwise annealed NiO x films (from 100 to 700 °C, 100 °C steps, on quartz substrates) demonstrated that sputtered NiO x does not exhibit evolution of any significant peak, even after annealing at high temperatures (Figure S1), which confirms the limited effect of annealing on the crystallite size. The crystallite sizes ( D ) of the NiO x films are calculated to be 9.9 nm for as-deposited NiO x following the Scherrer formula, which is consistent with an average crystallite size of 8–9 nm as determined by AFM analysis (Figure S2).…”
supporting
confidence: 77%
“…XRD analysis of stepwise annealed NiO x films (from 100 to 700 °C, 100 °C steps, on quartz substrates) demonstrated that sputtered NiO x does not exhibit evolution of any significant peak, even after annealing at high temperatures (Figure S1), which confirms the limited effect of annealing on the crystallite size. The crystallite sizes ( D ) of the NiO x films are calculated to be 9.9 nm for as-deposited NiO x following the Scherrer formula, which is consistent with an average crystallite size of 8–9 nm as determined by AFM analysis (Figure S2).…”
supporting
confidence: 77%
“…This study reports the system built up by incorporating a photoelectrochemical cell into a VR-flow battery to investigate the activity of the hybrid TiO 2 –In 2 S 3 photoelectrode materials for the very first time. In 2 S 3 thin films have been deposited on the glass substrates using ultrasonic spray pyrolysis (USP) system, as reported in our previous study . The thickness of the thin film photoelectrodes has been monitored by altering the pass number of the nozzle from 25-pass (25P) to 75-pass (75P) by delivering 6 μL·cm –2 precursor solution in each pass number.…”
supporting
confidence: 54%
“…In 2 S 3 thin films have been deposited on the glass substrates using ultrasonic spray pyrolysis (USP) system, as reported in our previous study. 17 material characterizations of the thin-film photoelectrodes have been given in the Supporting Information (Figures S1 and S2).…”
mentioning
confidence: 99%
“…The estimated crystallite size from X-ray diffraction values lies in the range of 10 -9 m and hence the relation L D > D holds good and indicates that no grain boundary scattering results in better charge transport. The change in carrier concentration and mobility values with the solvent volume does not arise due to the grain boundary scattering but only due to a small deviations as observed from EDS results which is proposed by Sankir et al[40].…”
supporting
confidence: 50%