2009
DOI: 10.1007/bf03246519
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Preparation and characterization of nanosized ZSM-5 zeolite using kaolin and investigation of kaolin content, crystallization time and temperature changes on the size and crystallinity of products

Abstract: Nano sized ZSM-5 zeolite samples were synthesized successively from kaolin clay as alumina source having a large amount of quartz (39%) and silicic acid as silica source by hydrothermal treatment with NaOH in the presence of tetrapropylammonium hydroxide as a template. Then the effect of kaolin content, crystallization temperature and time on the size and crystallinity of the products were investigated. The prepared samples were characterized using XRD, SEM, EDS and FT-IR techniques. The results showed that th… Show more

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Cited by 83 publications
(35 citation statements)
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“…In contrast, the PP/OD composite film without ZL yielded an amorphous halo in the 2θ range of 15-25°a s well as four sharp diffraction peaks at 2θ = 14.0, 16.9, 18.5, and 21.5°, which are attributed to the (110), (040), (130), and (301) crystal planes of pure PP, respectively [34]. Furthermore, the XRD patterns of the five PP/OD/ZL composite films with 3-30 wt% ZL show several crystalline peaks that are almost identical to those observed for pure ZL in the 2θ range of 5-30°, with their intensities proportional to the ZL content [14,32]. As the ZL content increased from 0 to 30%, the mean intermolecular distance related to the 2θ values of the (110), (040), (130), and (200) crystal planes of PP in the composite films slightly decreased in accordance with Bragg's law (see Table 2).…”
Section: Morphology Of the Pp/od/zl Composite Filmsmentioning
confidence: 73%
See 1 more Smart Citation
“…In contrast, the PP/OD composite film without ZL yielded an amorphous halo in the 2θ range of 15-25°a s well as four sharp diffraction peaks at 2θ = 14.0, 16.9, 18.5, and 21.5°, which are attributed to the (110), (040), (130), and (301) crystal planes of pure PP, respectively [34]. Furthermore, the XRD patterns of the five PP/OD/ZL composite films with 3-30 wt% ZL show several crystalline peaks that are almost identical to those observed for pure ZL in the 2θ range of 5-30°, with their intensities proportional to the ZL content [14,32]. As the ZL content increased from 0 to 30%, the mean intermolecular distance related to the 2θ values of the (110), (040), (130), and (200) crystal planes of PP in the composite films slightly decreased in accordance with Bragg's law (see Table 2).…”
Section: Morphology Of the Pp/od/zl Composite Filmsmentioning
confidence: 73%
“…Figure 3 shows the WAXD patterns of ZL and the PP/OD/ZL composite films, and the associated numerical values are summarized in Table 2. The XRD pattern of ZL shows several sharp diffraction peaks at 2θ = 7.9, 8.7, 14.7, 23.0, 23.9 and 24.5°, which correspond to (011), (020), (031), (051), (303) and (313) planes of the ZSM-5 zeolite structure [14,32,33]. In contrast, the PP/OD composite film without ZL yielded an amorphous halo in the 2θ range of 15-25°a s well as four sharp diffraction peaks at 2θ = 14.0, 16.9, 18.5, and 21.5°, which are attributed to the (110), (040), (130), and (301) crystal planes of pure PP, respectively [34].…”
Section: Morphology Of the Pp/od/zl Composite Filmsmentioning
confidence: 99%
“…Also, the Si-O-Si symmetric stretching vibration at 796 cm −1 was observed. This band might be related to the internal linkages in SiO 4 or AlO 4 of the ZSM-5 lattices [18,36]. The band near 546 cm −1 (double ring vibration) was presented for all catalysts, which indicated the formation of only ZSM-5 phase.…”
Section: -3 Ft-ir Spectramentioning
confidence: 92%
“…These steel plates were washed with water and used for the experiments as such. ZSM-5 NPs zeolite samples were synthesized from kaolin clay as alumina source having a large amount of quartz (39%) and silicic acid as silica source by hydrothermal treatment with NaOH in the presence of tetra propyl ammonium hydroxide as a template, according to procedure reported elsewhere [18]. The prepared sample was characterized using XRD and SEM technique.…”
Section: Apparatus and Analysismentioning
confidence: 99%