1993
DOI: 10.1016/0038-1098(93)90816-6
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Preparation and characterization of thin films of the heavy fermion superconductor UPd2Al3

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Cited by 42 publications
(24 citation statements)
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“…Fitting the dc data of Fig. 2 yields a gap value E g = 1.9 meV, which corresponds to the one reported in [2,10,14]. From point contact measurements a larger gap up to 12.4 meV was suggested [15].…”
supporting
confidence: 77%
See 1 more Smart Citation
“…Fitting the dc data of Fig. 2 yields a gap value E g = 1.9 meV, which corresponds to the one reported in [2,10,14]. From point contact measurements a larger gap up to 12.4 meV was suggested [15].…”
supporting
confidence: 77%
“…Based on this experimental evidence, UPd 2 Al 3 was described as a local-moment magnet and hence, the magnetic ordering should have only a minor influence on the electronic DOS. In this Letter we report on optical experiments at millimeter-submillimeter (mm-submm) wavelengths which clearly show the development of a pseudogap in the DOS in UPd 2 Al 3 below 25 K; our preliminary study on another film [9] showed the same features in the optical response; these findings cannot be easily explained by existing models.The highly c-axis oriented thin (150 nm) film of UPd 2 Al 3 was prepared on (111) oriented LaAlO 3 substrate (thickness 0.924 mm) by electron-beam coevaporation of the constituent elements in a molecularbeam epitaxy system [10]. The phase purity and structure of the film were investigated by X-ray and reflection high-energy electron diffraction.…”
mentioning
confidence: 99%
“…[30] We have grown thin films of UPd 2 Al 3 using MBE techniques: evaporation of the three constituents U, Pd, Al and deposition onto LaAlO 3 (111) substrates. [4,5,26] The excellent quality of these thin films is evident from x-ray analysis of the lattice as well as from the temperature dependence of the dc resistivity, which reproduces the features known from bulk single crystals. we directly calculate the complex conductivity.…”
Section: Methodsmentioning
confidence: 61%
“…To avoid the extremely high reflectivity of bulk samples, we studied 150 nm thick epitaxial UPd 2 Al 3 -films deposited on LaAlO 3 substrates by molecular beam epitaxy [39]. The physical properties of these thin films have been characterized carefully and match those of bulk single crystals.…”
Section: Experimental Methods and Resultsmentioning
confidence: 99%