Preparation and characterization of Tl₂Ba₂CaCu₂O₈superconducting films on biaxially textured Ni substrates

Abstract

The preparation and properties of Tl-2212 (Tl2Ba2CaCu2O8) thin films on biaxially textured Ni substrates, buffered with CeO2/YSZ/CeO2 trilayers, have been studied. Tl-2212 thin films were grown using a two-step fabrication process that involved magnetron sputtering and low temperature post-annealing. XRD θ–2θ scans, rocking curves and φ-scans proved that the Tl-2212 thin films were epitaxially grown on the buffered RABiTS. The critical temperature Tc and critical current Jc (77 K, 0 T) were 103 K and 2.6 MA cm−2, respectively.