Preparation and Properties of Pb_1-xSr_x(Zr_0.53Ti_0.47) O₃Thin Films by Sol-Gel Method

Abstract

Pb 1-x Sr x (Zr 0.53 Ti 0.47 ) O 3 (PSZT) thin films with different x values (x = 0, 0.02, 0.04, 0.06) are prepared by sol-gel method and their properties are studied. All PSZT thin films get a single perovskite phase. The dielectric properties are studied. The leakage current density at an applied electric field of 61.2 kV/cm is 293.0 × 10 −9 A/cm 2 when x = 0.04. The remanent polarization and coercive field values of the PSZT (x = 0) thin film are 8.4 µC/cm 2 and 67.5kV/cm, respectively.