2004
DOI: 10.1016/s0925-8388(03)00743-6
|View full text |Cite
|
Sign up to set email alerts
|

Preparation of InAs by annealing of two-layer In–As electrodeposits

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

3
15
0

Year Published

2004
2004
2016
2016

Publication Types

Select...
3
1
1

Relationship

1
4

Authors

Journals

citations
Cited by 12 publications
(18 citation statements)
references
References 20 publications
3
15
0
Order By: Relevance
“…Instead, the diffractograms presented two characteristic broad bands in the 2θ ranges 23-42 • and 46-62 • , denoting an X-ray amorphous structure. A more insightful analysis of this structure will be reported elsewhere [3]. As-plated Ga electrodeposits show all the peaks typical of OR-Ga, in agreement with the ASTM cards [20].…”
Section: Morphology and Crystallographic Structuresupporting
confidence: 69%
See 4 more Smart Citations
“…Instead, the diffractograms presented two characteristic broad bands in the 2θ ranges 23-42 • and 46-62 • , denoting an X-ray amorphous structure. A more insightful analysis of this structure will be reported elsewhere [3]. As-plated Ga electrodeposits show all the peaks typical of OR-Ga, in agreement with the ASTM cards [20].…”
Section: Morphology and Crystallographic Structuresupporting
confidence: 69%
“…Dependence of the logarithm of the Ga diffusion coefficient on the reverse of the absolute temperature (Arrhenius plot) for a-As deposits on polished Ga. Similar curves of Ga deposits on a-Sb [2] and of In deposits on a-As [3] and a-Sb [1] are also reported. diffusion of the electrodeposited and crystalline group III element (Ga and In) into the electrodeposited amorphous (a-) group V element (a-As and a-Sb).…”
Section: Discussionsupporting
confidence: 53%
See 3 more Smart Citations